Michael Pas

According to our database, Michael Pas authored at least 7 papers between 2015 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

2016

Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs.

Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Harnessing process variations for optimizing wafer-level probe-test flow.

Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 2016 IEEE International Test Conference, 2016

Harnessing fabrication process signature for predicting yield across designs.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

A machine learning approach to fab-of-origin attestation.

Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

2015

Yield prognosis for fab-to-fab product migration.

Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015