Constantinos Xanthopoulos

According to our database, Constantinos Xanthopoulos authored at least 16 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.

V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

2022

Improvements in Automated IC Socket Pin Defect Detection.

Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao

Proceedings of the IEEE International Test Conference, 2022

Zero Trust Approach to IC Manufacturing and Testing.

Brian Buras, Constantinos Xanthopoulos, Ken Butler, Jason Kim

Proceedings of the IEEE International Test Conference, 2022

2021

On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement.

Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation.

V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, E. De La Rosa, C. Alleyne, S. Mier, Yiorgos Makris

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

Automated Socket Anomaly Detection through Deep Learning.

Nidhi Agrawal, Min-Jian Yang, Constantinos Xanthopoulos, Vijayakumar Thangamariappan, Joe Xiao, Chee-Wah Ho, Keith Schaub, Ira Leventhal

Proceedings of the IEEE International Test Conference, 2020

2019

Machine Learning-based Noise Classification and Decomposition in RF Transceivers.

Deepika Neethirajan, Constantinos Xanthopoulos, Kiruba S. Subramani, Keith Schaub, Ira Leventhal, Yiorgos Makris

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion.

Kosuke Ikeda, Keith Schaub, Ira Leventhal, Yiorgos Makris, Constantinos Xanthopoulos, Deepika Neethirajan

Proceedings of the IEEE International Test Conference, 2019

Automated Die Inking through On-line Machine Learning.

Constantinos Xanthopoulos, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Wafer-Level Adaptive Vmin Calibration Seed Forecasting.

Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Enhanced hotspot detection through synthetic pattern generation and design of experiments.

Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

Automated die inking: A pattern recognition-based approach.

Constantinos Xanthopoulos, Peter Sarson, Heinz Reiter, Yiorgos Makris

Proceedings of the IEEE International Test Conference, 2017

Wafer-level adaptive trim seed forecasting based on E-tests.

Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2016

Harnessing process variations for optimizing wafer-level probe-test flow.

Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.

Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris

IEEE Des. Test, 2015

2014

IC laser trimming speed-up through wafer-level spatial correlation modeling.

Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2014 International Test Conference, 2014