Amit Nahar

According to our database, Amit Nahar authored at least 22 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.

V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, D. Webster, Amit Nahar, Yiorgos Makris

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

2022

Machine Learning-Based Overkill Reduction through Inter-Test Correlation.

Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2019

Wafer-Level Adaptive Vmin Calibration Seed Forecasting.

Constantinos Xanthopoulos, Deepika Neethirajan, Sirish Boddikurapati, Amit Nahar, Yiorgos Makris

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Special session on machine learning: How will machine learning transform test?

Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Wafer-level adaptive trim seed forecasting based on E-tests.

Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2016

Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs.

Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Statistical outlier screening as a test solution health monitor.

David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar

Proceedings of the 2016 IEEE International Test Conference, 2016

What we know after twelve years developing and deploying test data analytics solutions.

Kenneth M. Butler, Amit Nahar, W. Robert Daasch

Proceedings of the 2016 IEEE International Test Conference, 2016

Harnessing process variations for optimizing wafer-level probe-test flow.

Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 2016 IEEE International Test Conference, 2016

Harnessing fabrication process signature for predicting yield across designs.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

A machine learning approach to fab-of-origin attestation.

Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

2015

Yield prognosis for fab-to-fab product migration.

Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

2014

IC laser trimming speed-up through wafer-level spatial correlation modeling.

Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2014 International Test Conference, 2014

2013

Predicting die-level process variations from wafer test data for analog devices: A feasibility study.

Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 14th Latin American Test Workshop, 2013

2011

Die-level adaptive test: Real-time test reordering and elimination.

Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Adapting to adaptive testing.

Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Statistics in Semiconductor Test: Going beyond Yield.

W. Robert Daasch, C. Glenn Shirley, Amit Nahar

IEEE Des. Test Comput., 2009

Multidimensional Test Escape Rate Modeling.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch

IEEE Des. Test Comput., 2009

Quality improvement and cost reduction using statistical outlier methods.

Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger

Proceedings of the 27th International Conference on Computer Design, 2009

2005

Burn-in reduction using principal component analysis.

Amit Nahar, W. Robert Daasch, Suresh Subramaniam

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005