Mike Tripp

According to our database, Mike Tripp authored at least 9 papers between 2001 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

The Challenges of Nanotechnology and Gigacomplexity.

Gadi Singer, Rajesh Galivanche, Srinivas Patil, Mike Tripp

IEEE Des. Test Comput., 2009

2005

Drive only at speed functional testing; one of the techniques Intel is using to control test costs.

Mike Tripp, Silvio Picano, Baruch Schnarch

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Testing Gbps Interfaces without a Gigahertz Tester.

T. M. Mak, Mike Tripp, Anne Meixner

IEEE Des. Test Comput., 2004

Elimination of Traditional Functional Testing of Interface Timings at Intel.

Mike Tripp, T. M. Mak, Anne Meixner

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2004

ITC 2004 Panel: Cost of Test - Taking Control.

Mike Tripp

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Design considerations and DFT to enable testing of digital interfaces.

Mike Tripp, T. M. Mak, Anne Meixner

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2002

On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms).

Mike Tripp

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Realizing the Benefits of Structural Test for Intel Microprocessors.

Mike Mayberry, John Johnson, Navid Shahriari, Mike Tripp

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Reliability Beyond GHz.

Pete O'Neill, Ron Richmond, Mike Tripp, Barbara Vasquez, Art Wager, Zeev Weinberg

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001