Nicholas J. Pieper

According to our database, Nicholas J. Pieper authored at least 9 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Power and SER Performance of Flip-Flop Cells with Low-Leakage Options.

Nicholas J. Pieper, Y. Xiong, Jenna B. Kronenberg, R. Fung, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node.

Jenna B. Kronenberg, Y. Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node.

Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.

Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages.

Jenna B. Kronenberg, Yoni Xiong, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology.

Yoni Xiong, Yueh Chiang, Nicholas J. Pieper, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node.

Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.

Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Single-Event Latchup Vulnerability at the 7-nm FinFET Node.

Nicholas J. Pieper, Yoni Xiong, Alexandra Feeley, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022