Nilotpal Choudhury

According to our database1, Nilotpal Choudhury authored at least 5 papers between 2020 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
On the PBTI Reliability of Low EOT Negative Capacitance 1.8 nm HfO2-ZrO2 Superlattice Gate Stack on Lg=90 nm nFETs.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Decoupling of NBTI and Pure HCD Contributions in p-GAA SNS FETs Under Mixed VG/VD Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020


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