Chenming Hu

Orcid: 0009-0000-9599-3401

According to our database1, Chenming Hu authored at least 83 papers between 1989 and 2026.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 1990, "For contributions to the understanding of hot-electron effects in MOS devices.".

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

Online presence:

On csauthors.net:

Bibliography

2026
Spike-EVPR: Deep Spiking Residual Networks With SNN-Tailored Representations for Event-Based Visual Place Recognition.
IEEE Robotics Autom. Lett., June, 2026

2025
Physics-Informed Neural Networks for Device and Circuit Modeling: A Case Study of NeuroSPICE.
CoRR, December, 2025

EDE-Distill: Boosting Event-Based Monocular Depth Estimation Performance via Knowledge Distillation.
IEEE Robotics Autom. Lett., August, 2025

Fully Asynchronous Neuromorphic Perception for Mobile Robot Dodging With Loihi Chips.
IEEE Trans Autom. Sci. Eng., 2025

Orchard variable rate spraying method and experimental study based on multidimensional prescription maps.
Comput. Electron. Agric., 2025

Optimal Brain Apoptosis.
Proceedings of the Thirteenth International Conference on Learning Representations, 2025

2024
EV-MGRFlowNet: Motion-Guided Recurrent Network for Unsupervised Event-Based Optical Flow With Hybrid Motion-Compensation Loss.
IEEE Trans. Instrum. Meas., 2024

Spike-EVPR: Deep Spiking Residual Network with Cross-Representation Aggregation for Event-Based Visual Place Recognition.
CoRR, 2024

3DIC with Stacked FinFET, Inter-Level Metal, and Field-Size (25×33mm<sup>2</sup>) Single-Crystalline Si on SiO2 by Elevated-Epi.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023
Planning the temporary takeoff/landing site's location for a pesticide spraying helicopter based on an intelligent fusion algorithm.
Comput. Electron. Agric., June, 2023

Robust Compact Model of High-Voltage MOSFET's Drift Region.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023

Record Transconductance in Leff~30 nm Self-Aligned Replacement Gate ETSOI nFETs Using Low EOT Negative Capacitance HfO2-ZrO2 Superlattice Gate Stack.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2022
On the PBTI Reliability of Low EOT Negative Capacitance 1.8 nm HfO2-ZrO2 Superlattice Gate Stack on Lg=90 nm nFETs.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

Artificial Neural Network Surrogate Models for Efficient Design Space Exploration of 14-nm FinFETs.
Proceedings of the Device Research Conference, 2022

Compact Model for Trap Assisted Tunneling based GIDL.
Proceedings of the Device Research Conference, 2022

2021
Siamese target estimation network with AIoU loss for real-time visual tracking.
J. Vis. Commun. Image Represent., 2021

2020
Scanning the Issue.
Proc. IEEE, 2020

A Density Metric for Semiconductor Technology [Point of View].
Proc. IEEE, 2020

Non-local attention association scheme for online multi-object tracking.
Image Vis. Comput., 2020

Compact Device Models for FinFET and Beyond.
CoRR, 2020

Investigation of a preliminary ventilation energy-recovery system for poultry houses.
Comput. Electron. Agric., 2020

Reliability of Ferroelectric HfO2-based Memories: From MOS Capacitor to FeFET.
Proceedings of the 2020 Device Research Conference, 2020

2019
Investigation of bio-aerosol dispersion in a tunnel-ventilated poultry house.
Comput. Electron. Agric., 2019

Computational Fluid Dynamics aided investigation and optimization of a tunnel-ventilated poultry house in China.
Comput. Electron. Agric., 2019

BSIM-BULK: Accurate Compact Model for Analog and RF Circuit Design.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2019

2017
Modeling of Body-Bias Dependence of Overlap Capacitances in Bulk MOSFETs.
Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

Full chip power benefits with negative capacitance FETs.
Proceedings of the 2017 IEEE/ACM International Symposium on Low Power Electronics and Design, 2017

2016
Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG.
Microelectron. J., 2016

2015
Modeling STI Edge Parasitic Current for Accurate Circuit Simulations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

BSIM-CMG: Standard FinFET compact model for advanced circuit design.
Proceedings of the ESSCIRC Conference 2015, 2015

2013
BSIM - SPICE Models Enable FinFET and UTB IC Designs.
IEEE Access, 2013

BSIM compact MOSFET models for SPICE simulation.
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013

Flicker noise in advanced CMOS technology: Effects of halo implant.
Proceedings of the European Solid-State Device Research Conference, 2013

2012
BSIM - Industry standard compact MOSFET models.
Proceedings of the 38th European Solid-State Circuit conference, 2012

Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology.
Proceedings of the 38th European Solid-State Circuit conference, 2012

A non-iterative physical procedure for RF CMOS compact model extraction using BSIM6.
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011
New sub-20nm transistors: why and how.
Proceedings of the 48th Design Automation Conference, 2011

BSIM4 and MOSFET Modeling For IC Simulation
International Series on Advances in Solid State Electronics and Technology, World Scientific, ISBN: 978-981-4390-96-5, 2011

2010
Compact Modeling of Variation in FinFET SRAM Cells.
IEEE Des. Test Comput., 2010

2005
Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design.
IEEE Trans. Very Large Scale Integr. Syst., 2005

Charge-Based Core and the Model Architecture of BSIM5.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

2004
A Non-Charge-Sheet Based Analytical Model of Undoped Symmetric Double-Gate MOSFETs Using SPP Approach.
Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

The next generation BSIM for sub-100nm mixed-signal circuit simulation.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2003
Improved a priori interconnect predictions and technology extrapolation in the GTX system.
IEEE Trans. Very Large Scale Integr. Syst., 2003

Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Extremely scaled silicon nano-CMOS devices.
Proc. IEEE, 2003

Practical compact modeling approaches and options for sub-0.1 mum CMOS technologies.
Microelectron. Reliab., 2003

Loop-based interconnect modeling and optimization approach for multigigahertz clock network design.
IEEE J. Solid State Circuits, 2003

A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

A unified model for partial-depletion and full-depletion SOI circuit designs: using BSIMPD as a foundation.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002
Effective on-chip inductance modeling for multiple signal lines and application to repeater insertion.
IEEE Trans. Very Large Scale Integr. Syst., 2002

Impact of spatial intrachip gate length variability on theperformance of high-speed digital circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis.
Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002

Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD.
Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

Frequency-independent equivalent circuit model for on-chip spiral inductors.
Proceedings of the IEEE 2002 Custom Integrated Circuits Conference, 2002

2001
Accurate in situ measurement of peak noise and delay change induced by interconnect coupling.
IEEE J. Solid State Circuits, 2001

Efficient generation of pre-silicon MOS model parameters for early circuit design.
IEEE J. Solid State Circuits, 2001

Effective On-chip Inductance Modeling for Multiple Signal Lines and Application on Repeater Insertion.
Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

Methodology of self-heating free parameter extraction and circuit simulation for SOI CMOS.
Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

2000
A simple subcircuit extension of the BSIM3v3 model for CMOS RF design.
IEEE J. Solid State Circuits, 2000

Impact of Systematic Spatial Intra-Chip Gate Length Variability on Performance of High-Speed Digital Circuits.
Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000

Effects of Global Interconnect Optimizations on Performance Estimation of Deep Submicron Design.
Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000

BSIMPD: a partial-depletion SOI MOSFET model for deep-submicron CMOS designs.
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, 2000

New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation.
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, 2000

1999
Dynamic threshold pass-transistor logic for improved delay at lower power supply voltages.
IEEE J. Solid State Circuits, 1999

Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates.
IEEE J. Solid State Circuits, 1999

On Thermal Effects in Deep Sub-Micron VLSI Interconnects.
Proceedings of the 36th Conference on Design Automation, 1999

1998
A unified MOSFET channel charge model for device modeling in circuit simulation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

Investigation of interconnect capacitance characterization using charge-based capacitance measurement (CBCM) technique and three-dimensional simulation.
IEEE J. Solid State Circuits, 1998

Performance and V<sub>dd</sub> scaling in deep submicrometer CMOS.
IEEE J. Solid State Circuits, 1998

A Statistical Performance Simulation Methodology for VLSI Circuits.
Proceedings of the 35th Conference on Design Automation, 1998

Design in hot-carrier reliability for high performance logic applications.
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998

Performance and reliability of asymmetric LDD devices and logic gates.
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998

1997
Device and technology optimizations for low power design in deep sub-micron regime.
Proceedings of the 1997 International Symposium on Low Power Electronics and Design, 1997

1996
Device design for low power electronics with accurate deep submicrometer LDD-MOSFET models.
Proceedings of the 1996 International Symposium on Low Power Electronics and Design, 1996

1994
Hot-carrier-reliability design guidelines for CMOS logic circuits.
IEEE J. Solid State Circuits, March, 1994

1993
Berkeley reliability tools-BERT.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993

Future CMOS scaling and reliability.
Proc. IEEE, 1993

1992
IC reliability simulation.
IEEE J. Solid State Circuits, March, 1992

A non-quasi-static MOSFET model for SPICE-AC analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

1991
A charge conserving non-quasi-state (NQS) MOSFET model for SPICE transient analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

A charge sheet capacitance model of short channel MOSFETs for SPICE.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

1989
Reliability issues of MOS and bipolar ICs.
Proceedings of the Computer Design: VLSI in Computers and Processors, 1989


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