Nitanshu Chauhan

According to our database, Nitanshu Chauhan authored at least 10 papers between 2019 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective.

Aniket Gupta, Govind Bajpai, Navjeet Bagga, Shashank Banchhor, Sudeb Dasgupta, Anand Bulusu, Nitanshu Chauhan

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI.

Nitanshu Chauhan, Chirag Garg, Kai Ni, Amit Kumar Behera, Sarita Yadav, Shashank Banchhor, Navjeet Bagga, Avirup Dasgupta, Arnab Datta, Sudeb Dasgupta, Anand Bulusu

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.

Navjeet Bagga, Kai Ni, Nitanshu Chauhan, Om Prakash, X. Sharon Hu, Hussam Amrouch

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology.

Om Prakash, Nitanshu Chauhan, Aniket Gupta, Hussam Amrouch

Microelectron. J., 2021

Gain Stabilization Methodology for FinFET Amplifiers Considering Self-Heating Effect.

Shashank Banchhor, Nitanshu Chauhan, Aditya Doneria, Bulusu Anand

Proceedings of the 34th International Conference on VLSI Design and 20th International Conference on Embedded Systems, 2021

Behaviour of FinFET Inverter's Effective Capacitances in Low-Voltage Domain.

Sarita Yadav, Nitanshu Chauhan, Archana Pandey, Rajendra Pratap, Anand Bulusu

Proceedings of the 25th International Symposium on VLSI Design and Test, 2021

Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.

Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch, Nitanshu Chauhan

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Variability Effects in FinFET Transistors and Emerging NC-FinFET.

Aniket Gupta, Nitanshu Chauhan, Om Prakash, Hussam Amrouch

Proceedings of the International Conference on IC Design and Technology, 2021

2020

Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification.

Nitanshu Chauhan, Govind Bajpai, Shashank Banchhor, Navjeet Bagga

Proceedings of the 2020 24th International Symposium on VLSI Design and Test (VDAT), 2020

2019

Real Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things.

Govind Bajpai, Aniket Gupta, Nitanshu Chauhan

Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019