Hussam Amrouch

Affiliations:
  • Karlsruhe Institute of Technology, Germany


According to our database1, Hussam Amrouch authored at least 138 papers between 2011 and 2022.

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Bibliography

2022
FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies.
IEEE Trans. Very Large Scale Integr. Syst., 2022

Energy Efficient Edge Computing Enabled by Satisfaction Games and Approximate Computing.
IEEE Trans. Green Commun. Netw., 2022

Software-Managed Read and Write Wear-Leveling for Non-Volatile Main Memory.
ACM Trans. Embed. Comput. Syst., 2022

Towards a New Thermal Monitoring Based Framework for Embedded CPS Device Security.
IEEE Trans. Dependable Secur. Comput., 2022

Bridging the Gap Between Voltage Over-Scaling and Joint Hardware Accelerator-Algorithm Closed-Loop.
IEEE Trans. Circuits Syst. Video Technol., 2022

Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Full-Chip Power Density and Thermal Map Characterization for Commercial Microprocessors Under Heat Sink Cooling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU.
IEEE Trans. Computers, 2022

Real-Time Full-Chip Thermal Tracking: A Post-Silicon, Machine Learning Perspective.
IEEE Trans. Computers, 2022

A Framework for Crossing Temperature-Induced Timing Errors Underlying Hardware Accelerators to the Algorithm and Application Layers.
IEEE Trans. Computers, 2022

On the Reliability of FeFET On-Chip Memory.
IEEE Trans. Computers, 2022

Brain-Inspired Hyperdimensional Computing: How Thermal-Friendly for Edge Computing?
CoRR, 2022

HW/SW Co-design for Reliable In-memory Brain-inspired Hyperdimensional Computing.
CoRR, 2022

Modeling TPU Thermal Maps Under Superlattice Thermoelectric Cooling.
IEEE Access, 2022

Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Design Close to the Edge for Advanced Technology using Machine Learning and Brain-Inspired Algorithms.
Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022

2021
PROTON: Post-Synthesis Ferroelectric Thickness Optimization for NCFET Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

On the Resiliency of NCFET Circuits Against Voltage Over-Scaling.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

Automated Design Approximation to Overcome Circuit Aging.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

Post-Silicon Heat-Source Identification and Machine-Learning-Based Thermal Modeling Using Infrared Thermal Imaging.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Power-Efficient Heterogeneous Many-Core Design With NCFET Technology.
IEEE Trans. Computers, 2021

Performance Optimization of Analog Circuits in Negative Capacitance Transistor Technology.
Microelectron. J., 2021

On-Demand Mobile CPU Cooling With Thin-Film Thermoelectric Array.
IEEE Micro, 2021

Impact of NCFET on Neural Network Accelerators.
IEEE Access, 2021

Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient.
IEEE Access, 2021

Longevity of Commodity DRAMs in Harsh Environments Through Thermoelectric Cooling.
IEEE Access, 2021

Characterizing the Thermal Feasibility of Monolithic 3D Microprocessors.
IEEE Access, 2021

On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Special Session: Machine Learning for Semiconductor Test and Reliability.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Transistor Self-Heating: The Rising Challenge for Semiconductor Testing.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures.
Proceedings of the 29th IFIP/IEEE International Conference on Very Large Scale Integration, 2021

Self-Heating Effects from Transistors to Gates.
Proceedings of the International Symposium on VLSI Design, Automation and Test, 2021

On the Effectiveness of Quantization and Pruning on the Performance of FPGAs-based NN Temperature Estimation.
Proceedings of the 3rd ACM/IEEE Workshop on Machine Learning for CAD, 2021

Machine Learning for Circuit Aging Estimation under Workload Dependency.
Proceedings of the IEEE International Test Conference, 2021

Brain-Inspired Computing for Wafer Map Defect Pattern Classification.
Proceedings of the IEEE International Test Conference, 2021

Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Variability Effects in FinFET Transistors and Emerging NC-FinFET.
Proceedings of the International Conference on IC Design and Technology, 2021

Binarized SNNs: Efficient and Error-Resilient Spiking Neural Networks through Binarization.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

Positive/Negative Approximate Multipliers for DNN Accelerators.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

Security Closure of Physical Layouts ICCAD Special Session Paper.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

ICCAD Tutorial Session Paper Ferroelectric FET Technology and Applications: From Devices to Systems.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

Brain-Inspired Computing: Adventure from Beyond CMOS Technologies to Beyond von Neumann Architectures ICCAD Special Session Paper.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021

FeFET and NCFET for Future Neural Networks: Visions and Opportunities.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

Reliability-Aware Quantization for Anti-Aging NPUs.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

Control Variate Approximation for DNN Accelerators.
Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021

Impact of Negative Capacitance Field-Effect Transistor (NCFET) on Many-Core Systems.
Proceedings of the A Journey of Embedded and Cyber-Physical Systems, 2021

Approximate Computing for ML: State-of-the-art, Challenges and Visions.
Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021

Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications.
Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021

2020
Introduction to the Special Issue on Machine Learning for CAD.
ACM Trans. Design Autom. Electr. Syst., 2020

A Cross-Layer Gate-Level-to-Application Co-Simulation for Design Space Exploration of Approximate Circuits in HEVC Video Encoders.
IEEE Trans. Circuits Syst. Video Technol., 2020

Weight-Oriented Approximation for Energy-Efficient Neural Network Inference Accelerators.
IEEE Trans. Circuits Syst., 2020

On the Workload Dependence of Self-Heating in FinFET Circuits.
IEEE Trans. Circuits Syst. II Express Briefs, 2020

Aging Compensation With Dynamic Computation Approximation.
IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 2020

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology.
IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Exposing Hardware Trojans in Embedded Platforms via Short-Term Aging.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Dynamic Power and Energy Management for NCFET-Based Processors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

NPU Thermal Management.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Power Side-Channel Attacks in Negative Capacitance Transistor.
IEEE Micro, 2020

Power Side-Channel Attacks in Negative Capacitance Transistor (NCFET).
CoRR, 2020

Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management.
CoRR, 2020

SoftWear: Software-Only In-Memory Wear-Leveling for Non-Volatile Main Memory.
CoRR, 2020

Design Automation of Approximate Circuits With Runtime Reconfigurable Accuracy.
IEEE Access, 2020

Hardware Trojan Detection Using Controlled Circuit Aging.
IEEE Access, 2020

Towards NN-based Online Estimation of the Full-Chip Temperature and the Rate of Temperature Change.
Proceedings of the MLCAD '20: 2020 ACM/IEEE Workshop on Machine Learning for CAD, 2020

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Radiation on Negative Capacitance FinFET.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

Cell Library Characterization using Machine Learning for Design Technology Co-Optimization.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020

Energy Optimization in NCFET-based Processors.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Impact of NBTI Aging on Self-Heating in Nanowire FET.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management: Work-in-Progress.
Proceedings of the International Conference on Compilers, 2020

Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology.
Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

Machine Learning Based Online Full-Chip Heatmap Estimation.
Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

NCFET to Rescue Technology Scaling: Opportunities and Challenges.
Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019
Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.
IEEE Trans. Very Large Scale Integr. Syst., 2019

Estimating and Mitigating Aging Effects in Routing Network of FPGAs.
IEEE Trans. Very Large Scale Integr. Syst., 2019

Modeling and Evaluating the Gate Length Dependence of BTI.
IEEE Trans. Circuits Syst. II Express Briefs, 2019

Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level.
IEEE Trans. Circuits Syst. I Regul. Pap., 2019

Dynamic Guardband Selection: Thermal-Aware Optimization for Unreliable Multi-Core Systems.
IEEE Trans. Computers, 2019

On the Efficiency of Voltage Overscaling under Temperature and Aging Effects.
IEEE Trans. Computers, 2019

Rebirth-FTL: Lifetime optimization via Approximate Storage for NAND Flash.
Proceedings of the 2019 IEEE Non-Volatile Memory Systems and Applications Symposium, 2019

NCFET-Aware Voltage Scaling.
Proceedings of the 2019 IEEE/ACM International Symposium on Low Power Electronics and Design, 2019

Aging Gracefully with Approximation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Reliability Challenges with Self-Heating and Aging in FinFET Technology.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

The Impact of Emerging Technologies on Architectures and System-level Management: Invited Paper.
Proceedings of the International Conference on Computer-Aided Design, 2019

Selecting the Optimal Energy Point in Near-Threshold Computing.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

Performance, Power and Cooling Trade-Offs with NCFET-based Many-Cores.
Proceedings of the 56th Annual Design Automation Conference 2019, 2019

2018
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Aging-Aware Boosting.
IEEE Trans. Computers, 2018

Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited).
Integr., 2018

Negative Capacitance Transistor to Address the Fundamental Limitations in Technology Scaling: Processor Performance.
IEEE Access, 2018

Voltage Adaptation Under Temperature Variation.
Proceedings of the 15th International Conference on Synthesis, 2018

Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Trading Off Temperature Guardbands via Adaptive Approximations.
Proceedings of the 36th IEEE International Conference on Computer Design, 2018

Dynamic resource management for heterogeneous many-cores.
Proceedings of the International Conference on Computer-Aided Design, 2018

Estimating and optimizing BTI aging effects: from physics to CAD.
Proceedings of the International Conference on Computer-Aided Design, 2018

Aging-constrained performance optimization for multi cores.
Proceedings of the 55th Annual Design Automation Conference, 2018

2017
Interdependencies of Degradation Effects and Their Impact on Computing.
IEEE Des. Test, 2017

Containing Guardbands: From the Macro to Micro Time Domain.
Proceedings of the Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 2017

Evaluating and mitigating degradation effects in multimedia circuits.
Proceedings of the 15th IEEE/ACM Symposium on Embedded Systems for Real-Time Multimedia, 2017

Hardware and software innovations in energy-efficient system-reliability monitoring.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies).
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

Optimizing temperature guardbands.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

Towards Aging-Induced Approximations.
Proceedings of the 54th Annual Design Automation Conference, 2017

Emerging (un-)reliability based security threats and mitigations for embedded systems: special session.
Proceedings of the 2017 International Conference on Compilers, 2017

Containing guardbands.
Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016
Designing reliable, yet energy-efficient guardbands.
Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016

Stress-aware routing to mitigate aging effects in SRAM-based FPGAs.
Proceedings of the 26th International Conference on Field Programmable Logic and Applications, 2016

Aging-aware voltage scaling.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Designing guardbands for instantaneous aging effects.
Proceedings of the 53rd Annual Design Automation Conference, 2016

Improving mobile gaming performance through cooperative CPU-GPU thermal management.
Proceedings of the 53rd Annual Design Automation Conference, 2016

Reliability-aware design to suppress aging.
Proceedings of the 53rd Annual Design Automation Conference, 2016

Power and thermal management in massive multicore chips: theoretical foundation meets architectural innovation and resource allocation.
Proceedings of the 2016 International Conference on Compilers, 2016

2015
Techniques for Aging, Soft Errors and Temperature to Increase the Reliability of Embedded On-Chip Systems.
PhD thesis, 2015

Lucid infrared thermography of thermally-constrained processors.
Proceedings of the IEEE/ACM International Symposium on Low Power Electronics and Design, 2015

Connecting the physical and application level towards grasping aging effects.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Reliability degradation in the scope of aging - From physical to system level.
Proceedings of the 10th International Design & Test Symposium, 2015

2014
RESI: Register-Embedded Self-Immunity for Reliability Enhancement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Towards interdependencies of aging mechanisms.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

hevcDTM: Application-driven Dynamic Thermal Management for High Efficiency Video Coding.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

mDTM: Multi-objective dynamic thermal management for on-chip systems.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013
Analyzing the thermal hotspots in FPGA-based embedded systems.
Proceedings of the 23rd International Conference on Field programmable Logic and Applications, 2013

Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits.
Proceedings of the 21st IEEE Annual International Symposium on Field-Programmable Custom Computing Machines, 2013

Stress balancing to mitigate NBTI effects in register files.
Proceedings of the 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2013

Thermal management for dependable on-chip systems.
Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013

2012
COOL: control-based optimization of load-balancing for thermal behavior.
Proceedings of the 10th International Conference on Hardware/Software Codesign and System Synthesis, 2012

2011
Self-Immunity Technique to Improve Register File Integrity Against Soft Errors.
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011


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