Hussam Amrouch

Leandro Mateus Giacomini Rocha

Marilyn Wolf

ACM Trans. Design Autom. Electr. Syst., 2020

A Cross-Layer Gate-Level-to-Application Co-Simulation for Design Space Exploration of Approximate Circuits in HEVC Video Encoders.

[BibT_eX]

[DOI]

Guilherme Paim

Eduardo Antônio César da Costa

Sergio Bampi

IEEE Trans. Circuits Syst. Video Technol., 2020

On the Workload Dependence of Self-Heating in FinFET Circuits.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2020

Aging Compensation With Dynamic Computation Approximation.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 2020

Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

Exposing Hardware Trojans in Embedded Platforms via Short-Term Aging.

[BibT_eX]

[DOI]

Virinchi Roy Surabhi

Prashanth Krishnamurthy

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Dynamic Power and Energy Management for NCFET-Based Processors.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

NPU Thermal Management.

[BibT_eX]

[DOI]

Iraklis Anagnostopoulos

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Power Side-Channel Attacks in Negative Capacitance Transistor.

[BibT_eX]

[DOI]

IEEE Micro, 2020

Power Side-Channel Attacks in Negative Capacitance Transistor (NCFET).

[BibT_eX]

[DOI]

CoRR, 2020

Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management.

[BibT_eX]

[DOI]

CoRR, 2020

SoftWear: Software-Only In-Memory Wear-Leveling for Non-Volatile Main Memory.

[BibT_eX]

[DOI]

Christian Hakert

Kuan-Hsun Chen

Paul R. Genssler

Georg von der Brüggen

CoRR, 2020

Design Automation of Approximate Circuits With Runtime Reconfigurable Accuracy.

[BibT_eX]

[DOI]

Georgios Zervakis

IEEE Access, 2020

Hardware Trojan Detection Using Controlled Circuit Aging.

[BibT_eX]

[DOI]

Virinchi Roy Surabhi

Prashanth Krishnamurthy

IEEE Access, 2020

BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Radiation on Negative Capacitance FinFET.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Energy Optimization in NCFET-based Processors.

[BibT_eX]

[DOI]

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Impact of NBTI Aging on Self-Heating in Nanowire FET.

[BibT_eX]

[DOI]

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Run-Time Accuracy Reconfigurable Stochastic Computing for Dynamic Reliability and Power Management: Work-in-Progress.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Compilers, 2020

Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology.

[BibT_eX]

[DOI]

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

Machine Learning Based Online Full-Chip Heatmap Estimation.

[BibT_eX]

[DOI]

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

NCFET to Rescue Technology Scaling: Opportunities and Challenges.

[BibT_eX]

[DOI]

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Modeling the Interdependences Between Voltage Fluctuation and BTI Aging.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2019

Estimating and Mitigating Aging Effects in Routing Network of FPGAs.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2019

Modeling and Evaluating the Gate Length Dependence of BTI.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2019

Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. I Regul. Pap., 2019

Dynamic Guardband Selection: Thermal-Aware Optimization for Unreliable Multi-Core Systems.

[BibT_eX]

[DOI]

Heba Khdr

IEEE Trans. Computers, 2019

On the Efficiency of Voltage Overscaling under Temperature and Aging Effects.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 2019

Rebirth-FTL: Lifetime optimization via Approximate Storage for NAND Flash.

[BibT_eX]

[DOI]

Proceedings of the 2019 IEEE Non-Volatile Memory Systems and Applications Symposium, 2019

NCFET-Aware Voltage Scaling.

[BibT_eX]

[DOI]

Proceedings of the 2019 IEEE/ACM International Symposium on Low Power Electronics and Design, 2019

Aging Gracefully with Approximation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Reliability Challenges with Self-Heating and Aging in FinFET Technology.

[BibT_eX]

[DOI]

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

The Impact of Emerging Technologies on Architectures and System-level Management: Invited Paper.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Computer-Aided Design, 2019

Selecting the Optimal Energy Point in Near-Threshold Computing.

[BibT_eX]

[DOI]

Sami Salamin

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

Hot Spot Identification and System Parameterized Thermal Modeling for Multi-Core Processors Through Infrared Thermal Imaging.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

Performance, Power and Cooling Trade-Offs with NCFET-based Many-Cores.

[BibT_eX]

[DOI]

Proceedings of the 56th Annual Design Automation Conference 2019, 2019

2018

Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.

[BibT_eX]

[DOI]

Montserrat Nafría

IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Aging-Aware Boosting.

[BibT_eX]

[DOI]

Heba Khdr

IEEE Trans. Computers, 2018

Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited).

[BibT_eX]

[DOI]

Integr., 2018

Negative Capacitance Transistor to Address the Fundamental Limitations in Technology Scaling: Processor Performance.

[BibT_eX]

[DOI]

IEEE Access, 2018

Voltage Adaptation Under Temperature Variation.

[BibT_eX]

[DOI]

Behnam Khaleghi

Proceedings of the 15th International Conference on Synthesis, 2018

Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.

[BibT_eX]

[DOI]

Javier Diaz-Fortuny

Rosana Rodríguez

Rafael Castro-López

Elisenda Roca

Francisco V. Fernández

Montserrat Nafría

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Trading Off Temperature Guardbands via Adaptive Approximations.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE International Conference on Computer Design, 2018

Dynamic resource management for heterogeneous many-cores.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Computer-Aided Design, 2018

Estimating and optimizing BTI aging effects: from physics to CAD.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Computer-Aided Design, 2018

Aging-constrained performance optimization for multi cores.

[BibT_eX]

[DOI]

Heba Khdr

Proceedings of the 55th Annual Design Automation Conference, 2018

2017

Interdependencies of Degradation Effects and Their Impact on Computing.

[BibT_eX]

[DOI]

IEEE Des. Test, 2017

Containing Guardbands: From the Macro to Micro Time Domain.

[BibT_eX]

Proceedings of the Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 2017

Evaluating and mitigating degradation effects in multimedia circuits.

[BibT_eX]

[DOI]

Proceedings of the 15th IEEE/ACM Symposium on Embedded Systems for Real-Time Multimedia, 2017

Hardware and software innovations in energy-efficient system-reliability monitoring.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies).

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

Optimizing temperature guardbands.

[BibT_eX]

[DOI]

Behnam Khaleghi

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

Towards Aging-Induced Approximations.

[BibT_eX]

[DOI]

Proceedings of the 54th Annual Design Automation Conference, 2017

Emerging (un-)reliability based security threats and mitigations for embedded systems: special session.

[BibT_eX]

[DOI]

Prashanth Krishnamurthy

Proceedings of the 2017 International Conference on Compilers, 2017

Containing guardbands.

[BibT_eX]

[DOI]

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

Designing reliable, yet energy-efficient guardbands.

[BibT_eX]

[DOI]

Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016

Stress-aware routing to mitigate aging effects in SRAM-based FPGAs.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on Field Programmable Logic and Applications, 2016

Aging-aware voltage scaling.

[BibT_eX]

[DOI]

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Designing guardbands for instantaneous aging effects.

[BibT_eX]

[DOI]

Montserrat Nafría

Proceedings of the 53rd Annual Design Automation Conference, 2016

Improving mobile gaming performance through cooperative CPU-GPU thermal management.

[BibT_eX]

[DOI]

Proceedings of the 53rd Annual Design Automation Conference, 2016

Reliability-aware design to suppress aging.

[BibT_eX]

[DOI]

Proceedings of the 53rd Annual Design Automation Conference, 2016

Power and thermal management in massive multicore chips: theoretical foundation meets architectural innovation and resource allocation.

[BibT_eX]

[DOI]

Proceedings of the 2016 International Conference on Compilers, 2016

2015

Techniques for Aging, Soft Errors and Temperature to Increase the Reliability of Embedded On-Chip Systems.

[BibT_eX]

[DOI]

PhD thesis, 2015

Lucid infrared thermography of thermally-constrained processors.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Symposium on Low Power Electronics and Design, 2015

Connecting the physical and application level towards grasping aging effects.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Reliability degradation in the scope of aging - From physical to system level.

[BibT_eX]

[DOI]

Proceedings of the 10th International Design & Test Symposium, 2015

2014

RESI: Register-Embedded Self-Immunity for Reliability Enhancement.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Towards interdependencies of aging mechanisms.

[BibT_eX]

[DOI]

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

hevcDTM: Application-driven Dynamic Thermal Management for High Efficiency Video Coding.

[BibT_eX]

[DOI]

Daniel Palomino

Muhammad Shafique

Altamiro Amadeu Susin

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

mDTM: Multi-objective dynamic thermal management for on-chip systems.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Analyzing the thermal hotspots in FPGA-based embedded systems.

[BibT_eX]

[DOI]

Josef Schneider

Sridevan Parameswaran

Proceedings of the 23rd International Conference on Field programmable Logic and Applications, 2013

Accurate Thermal-Profile Estimation and Validation for FPGA-Mapped Circuits.

[BibT_eX]

[DOI]

Mehdi Baradaran Tahoori

Proceedings of the 21st IEEE Annual International Symposium on Field-Programmable Custom Computing Machines, 2013

Stress balancing to mitigate NBTI effects in register files.

[BibT_eX]

[DOI]

Proceedings of the 2013 43rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2013

Thermal management for dependable on-chip systems.

[BibT_eX]

[DOI]

Proceedings of the 18th Asia and South Pacific Design Automation Conference, 2013

2012

COOL: control-based optimization of load-balancing for thermal behavior.

[BibT_eX]

[DOI]

Proceedings of the 10th International Conference on Hardware/Software Codesign and System Synthesis, 2012

2011

Self-Immunity Technique to Improve Register File Integrity Against Soft Errors.

[BibT_eX]

[DOI]