Govind Bajpai

According to our database1, Govind Bajpai authored at least 5 papers between 2019 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2022
Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective.
Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

2021
Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification.
Proceedings of the 2020 24th International Symposium on VLSI Design and Test (VDAT), 2020

Impact of Radiation on Negative Capacitance FinFET.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Real Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things.
Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019


  Loading...