According to our database1, Govind Bajpai authored at least 4 papers between 2019 and 2021.
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Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification.
Proceedings of the 2020 24th International Symposium on VLSI Design and Test (VDAT), 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Real Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things.
Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019