Patrick Fiorenza

According to our database, Patrick Fiorenza authored at least 7 papers between 2007 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs.

Patrick Fiorenza, Francesco Cordiano, Mario Santo Alessandrino, Alfio Russo, Edoardo Zanetti, Mario Saggio, C. Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability.

Beatrice Carbone, Mario Santo Alessandrino, Alfio Russo, Elisa Vitanza, Filippo Giannazzo, Patrick Fiorenza, Fabrizio Roccaforte

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage instability in power MOSFETs.

Patrick Fiorenza, Corrado Bongiorno, Angelo Alberto Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs.

Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, S. Cascino, Angelo Alberto Messina, Vincenzo Vinciguerra, Michele Calabretta, Alessandro Chini

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer.

Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects.

Patrick Fiorenza, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, Clarice Di Martino, Alfio Russo, Mario Saggio, Carlo Venuto, Elisa Vitanza, Edoardo Zanetti, Filippo Giannazzo, Fabrizio Roccaforte

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2007

Defects induced anomalous breakdown kinetics in Pr₂O₃ by micro- and nano-characterization.

Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G. Toro, Graziella Malandrino, Ignazio L. Fragalà

Microelectron. Reliab., 2007