Patrick Ndai

According to our database1, Patrick Ndai authored at least 12 papers between 2005 and 2011.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2011
A Read-Disturb-Free, Differential Sensing 1R/1W Port, 8T Bitcell Array.
IEEE Trans. Very Large Scale Integr. Syst., 2011

2010
Trifecta: A Nonspeculative Scheme to Exploit Common, Data-Dependent Subcritical Paths.
IEEE Trans. Very Large Scale Integr. Syst., 2010

A Scalable Circuit-Architecture Co-Design to Improve Memory Yield for High-Performance Processors.
IEEE Trans. Very Large Scale Integr. Syst., 2010

Design Paradigm for Robust Spin-Torque Transfer Magnetic RAM (STT MRAM) From Circuit/Architecture Perspective.
IEEE Trans. Very Large Scale Integr. Syst., 2010

2009
REad/access-preferred (REAP) SRAM - architecture-aware bit cell design for improved yield and lower VMIN.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

An alternate design paradigm for robust spin-torque transfer magnetic RAM (STT MRAM) from circuit/architecture perspective.
Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008
Within-Die Variation-Aware Scheduling in Superscalar Processors for Improved Throughput.
IEEE Trans. Computers, 2008

O<sup>2</sup>C: occasional two-cycle operations for dynamic thermal management in high performance in-order microprocessors.
Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008

A Novel Low Overhead Fault Tolerant Kogge-Stone Adder Using Adaptive Clocking.
Proceedings of the Design, Automation and Test in Europe, 2008

2007
Fine-Grained Redundancy in Adders.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Tolerance to Small Delay Defects by Adaptive Clock Stretching.
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2005
A Soft Error Monitor Using Switching Current Detection.
Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005


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