Peter Lagger

According to our database1, Peter Lagger authored at least 3 papers between 2012 and 2018.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2018
Review of bias-temperature instabilities at the III-N/dielectric interface.
Microelectronics Reliability, 2018

2015
Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2012
Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure.
Microelectronics Reliability, 2012


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