According to our database1, Peter Lagger authored at least 3 papers between 2012 and 2018.
Legend:Book In proceedings Article PhD thesis Other
Review of bias-temperature instabilities at the III-N/dielectric interface.
Microelectronics Reliability, 2018
Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure.
Microelectronics Reliability, 2012