R. Dean Adams

According to our database1, R. Dean Adams authored at least 12 papers between 1995 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2004
An Integrated Memory Self Test and EDA Solution.
Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004

2002
Design and Test of a 9-port SRAM for a 100Gb/s STS-1 Switch.
Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

2001
Bitline contacts in high density SRAMs: design for testability and stressability.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Defect Analysis and a New Fault Model for Multi-port SRAMs.
Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000
Silicon-on-Insulator Technology Impacts on SRAM Testing.
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories.
Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

Self test architecture for testing complex memory structures.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999
The Limits of Digital Testing for Dynamic Circuits.
Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1998
Quad DCVS dynamic logic fault modeling and testing.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997
A Self-Test Circuit for Evaluating Memory Sense-Amplifier Signal.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1995
Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

A 370-MHz memory built-in self-test state machine.
Proceedings of the 1995 European Design and Test Conference, 1995


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