Harold Pilo

According to our database1, Harold Pilo authored at least 11 papers between 2000 and 2013.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

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Bibliography

2013
A 64Mb SRAM in 22nm SOI technology featuring fine-granularity power gating and low-energy power-supply-partition techniques for 37% leakage reduction.
Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012
A 64 Mb SRAM in 32 nm High-k Metal-Gate SOI Technology With 0.7 V Operation Enabled by Stability, Write-Ability and Read-Ability Enhancements.
IEEE J. Solid State Circuits, 2012

2011
A 64Mb SRAM in 32nm High-k metal-gate SOI technology with 0.7V operation enabled by stability, write-ability and read-ability enhancements.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011

2009
An 8 Mb SRAM in 45 nm SOI Featuring a Two-Stage Sensing Scheme and Dynamic Power Management.
IEEE J. Solid State Circuits, 2009

2008
A 450ps Access-Time SRAM Macro in 45nm SOI Featuring a Two-Stage Sensing-Scheme and Dynamic Power Management.
Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

2007
An SRAM Design in 65-nm Technology Node Featuring Read and Write-Assist Circuits to Expand Operating Voltage.
IEEE J. Solid State Circuits, 2007

A 550ps Access-Time Compilable SRAM in 65nm CMOS Technology.
Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2003
A 5.6-ns random cycle 144-Mb DRAM with 1.4 Gb/s/pin and DDR3-SRAM interface.
IEEE J. Solid State Circuits, 2003

2001
Bitline contacts in high density SRAMs: design for testability and stressability.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000
An 833-MHz 1.5-W 18-Mb CMOS SRAM with 1.67 Gb/s/pin.
IEEE J. Solid State Circuits, 2000

Design-for-test methods for stand-alone SRAMs at 1 Gb/s/pin and beyond.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000


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