According to our database1, Dwayne Burek authored at least 6 papers between 1992 and 2006.
Legend:Book In proceedings Article PhD thesis Other
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004
Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips.
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992