Dwayne Burek

According to our database1, Dwayne Burek authored at least 6 papers between 1992 and 2006.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2006
OCI: Open Compression Interface.
Proceedings of the 2006 IEEE International Test Conference, 2006

2004
An Integrated Memory Self Test and EDA Solution.
Proceedings of the 12th IEEE International Workshop on Memory Technology, 2004

2002
Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips.
Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001
IP and Automation to Support IEEE P1500.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

1994
ScanBist: A Multifrequency Scan-Based BIST Method.
IEEE Des. Test Comput., 1994

1992
ScanBIST: A Multi-frequency Scan-based BIST Method.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992


  Loading...