R. Malneedi

According to our database, R. Malneedi authored at least 1 paper in 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Low cost at-speed testing using On-Product Clock Generation compatible with test compression.

Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, Gary Grise

Proceedings of the 2011 IEEE International Test Conference, 2010