Gary Grise

According to our database, Gary Grise authored at least 7 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Low cost at-speed testing using On-Product Clock Generation compatible with test compression.

Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, Gary Grise

Proceedings of the 2011 IEEE International Test Conference, 2010

2007

An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs.

Vikram Iyengar, Kenneth Pichamuthu, Andrew Ferko, Frank Woytowich, David E. Lackey, Gary Grise, Mark Taylor, Mike Degregorio, Steven F. Oakland

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation.

Anis Uzzaman, Bibo Li, Thomas J. Snethen, Brion L. Keller, Gary Grise

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

At-Speed Structural Test For High-Performance ASICs.

Vikram Iyengar, Toshihiko Yokota, Kazuhiro Yamada, Theo Anemikos, Bob Bassett, Mike Degregorio, Rudy Farmer, Gary Grise, Mark Johnson, Dave Milton, Mark Taylor, Frank Woytowich

Proceedings of the 2006 IEEE International Test Conference, 2006

Performance verification of high-performance ASICs using at-speed structural test.

Vikram Iyengar, Mark Johnson, Theo Anemikos, Bob Bassett, Mike Degregorio, Rudy Farmer, Gary Grise, Phil Stevens, Mark Taylor, Frank Woytowich

Proceedings of the 16th ACM Great Lakes Symposium on VLSI 2006, Philadelphia, PA, USA, April 30, 2006

A flexible and scalable methodology for GHz-speed structural test.

Vikram Iyengar, Gary Grise, Mark Taylor

Proceedings of the 43rd Design Automation Conference, 2006

Design For At-Speed Structural Test And Performance Verification Of High-Performance ASICs.

Vikram Iyengar, Mark Johnson, Theo Anemikos, Gary Grise, Mark Taylor, Raymond Farmer, Frank Woytowich, Bob Bassett

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006