Rajeshwary Tayade

According to our database, Rajeshwary Tayade authored at least 8 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Critical Path Selection for Delay Testing Considering Coupling Noise.

Rajeshwary Tayade, Jacob A. Abraham

J. Electron. Test., 2009

Critical Path Selection for Delay Test Considering Coupling Noise.

Rajeshwary Tayade, Jacob A. Abraham

Proceedings of the 14th IEEE European Test Symposium, 2009

2008

Small-delay defect detection in the presence of process variations.

Rajeshwary Tayade, Jacob A. Abraham

Microelectron. J., 2008

On-chip Programmable Capture for Accurate Path Delay Test and Characterization.

Rajeshwary Tayade, Jacob A. Abraham

Proceedings of the 2008 IEEE International Test Conference, 2008

Analytical model for the impact of multiple input switching noise on timing.

Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham

Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2007

Small-Delay Defect Detection in the Presence of Process Variations.

Rajeshwary Tayade, Savithri Sundareswaran, Jacob A. Abraham

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Estimating path delay distribution considering coupling noise.

Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham

Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, 2007

2004

Fast Simulation Technique for LDPC Code Analysis.

Rajeshwary Tayade, Gwan Choi

Proceedings of the International Conference on Wireless Networks, 2004