S. Duzellier

According to our database, S. Duzellier authored at least 2 papers between 2000 and 2009.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2009

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror.

Corinne Bestory, François Marc, S. Duzellier, Hervé Levi

Microelectron. Reliab., 2009

2000

An Overview of the Applications of a Pulsed Laser System for SEU Testing.

Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000