R. Ecoffet

According to our database, R. Ecoffet authored at least 4 papers between 1998 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.

Alain Michez, Jerome Boch, S. Dhombres, Frédéric Saigné, Antoine D. Touboul, J.-R. Vaillé, Laurent Dusseau, E. Lorfèvre, R. Ecoffet

Microelectron. Reliab., 2013

2005

How to Characterize the Problem of SEU in Processors and Representative Errors Observed on Flight.

Raoul Velazco, R. Ecoffet, F. Faure

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2000

An Overview of the Applications of a Pulsed Laser System for SEU Testing.

Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

1998

Operation in Space of Artificial Neural Networks Implemented by Means of a Dedicated Architecture based on a Transputer.

Raoul Velazco, Ph. Cheynet, R. Ecoffet

Proceedings of the 11th Annual Symposium on Integrated Circuits Design, 1998