Subhadip Kundu

According to our database, Subhadip Kundu authored at least 23 papers between 2008 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network.

Subhadip Kundu, Jais Abraham

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

2022

Using Custom Fault Models to Improve Understanding of Silicon Failures.

Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan

Proceedings of the IEEE International Test Conference, 2022

2017

Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set.

Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur

Proceedings of the IEEE International Test Conference, 2017

2016

Post-Silicon Validation and Diagnosis.

Kanad Basu, Subhadip Kundu

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors.

Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment.

Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

IEEE Trans. Very Large Scale Integr. Syst., 2015

A hardware based low temperature solution for VLSI testing using decompressor side masking.

Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay, Bijit Kumar Das

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Fault diagnosis in designs with extreme low pin test data compressors.

Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization.

Subhadip Kundu, Aniket Jha, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

IEEE Trans. Very Large Scale Integr. Syst., 2014

2013

A Metric for Test Set Characterization and Customization Toward Fault Diagnosis.

Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Aggresive scan chain masking for improved diagnosis of multiple scan chain failures.

Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

Proceedings of the 18th IEEE European Test Symposium, 2013

An ATE assisted DFD technique for volume diagnosis of scan chains.

Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing.

Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing.

S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay

Integr., 2012

Efficient don't care filling and scan chain masking for low-power testing.

Subhadip Kundu, Santanu Chattopadhyay

Int. J. Comput. Aided Eng. Technol., 2012

A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection.

Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

Proceedings of the 25th International Conference on VLSI Design, 2012

Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip.

Bibhas Ghoshal, Subhadip Kundu, Indranil Sengupta, Santanu Chattopadhyay

Proceedings of the Progress in VLSI Design and Test - 16th International Symposium, 2012

Confidence Based Power Aware Testing.

Tapas Kumar Maiti, Subhadip Kundu, Arpita Dutta, Santanu Chattopadhyay

Proceedings of the International Symposium on Electronic System Design, 2012

2011

Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization.

Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur

Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011

2010

Customizing pattern set for test power reduction via improved X-identification and reordering.

S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay

Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010

2009

Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption.

Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Efficient Don't Care Filling for Power Reduction during Testing.

Subhadip Kundu, Santanu Chattopadhyay

Proceedings of the ARTCom 2009, 2009

2008

A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing.

Subhadip Kundu, Santanu Chattopadhyay, Kanchan Manna

Proceedings of the IEEE Reglon 10 Colloquium and Third International Conference on Industrial and Information Systems, 2008