Ajay Khoche

According to our database, Ajay Khoche authored at least 24 papers between 1992 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System.

Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak

IEEE Des. Test, 2013

2010

STIL P1450.4: A standard for test flow specification.

Jim O'Reilly, Ajay Khoche, Ernst Wahl, Bruce R. Parnas

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

STDF Memory Fail Datalog Standard.

Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Songlin Zuo, Liyang Lai, John Rowe, Thomas Zanon

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

A Tutorial on STDF Fail Datalog Standard.

Ajay Khoche, Phil Burlison, John Rowe, Glenn Plowman

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges.

Ajay Khoche

IEEE Des. Test Comput., 2006

Session Abstract.

Ajay Khoche, Mike Rodgers, Pete O'Neil

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Session Abstract.

Ajay Khoche, Peter Muhmenthaler

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Session Abstract.

Ajay Khoche

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics.

Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer

Proceedings of the 2006 IEEE International Test Conference, 2006

The Next Step in Volume Scan Diagnosis: Standard Fail Data Format.

Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang

Proceedings of the 15th Asian Test Symposium, 2006

2003

Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits.

Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges

J. Electron. Test., 2003

2002

Test Economics for Multi-site Test with Modern Cost Reduction Techniques.

Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Test Vector Compression Using EDA-ATE Synergies.

Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Packet-Based Input Test Data Compression Techniques.

Erik H. Volkerink, Ajay Khoche, Subhasish Mitra

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Tackling test trade-offs from design, manufacturing to market using economic modeling.

Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

A new methodology for improved tester utilization.

Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1997

Critical hazard free test generation for asynchronous circuits.

Ajay Khoche, Erik Brunvand

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

ACT: A DFT Tool for Self-Timed Circuits.

Ajay Khoche, Erik Brunvand

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1995

A partial scan methodology for testing self-timed circuits.

Ajay Khoche, Erik Brunvand

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

DFT for fast testing of self-timed control circuits.

Sandeep Pagey, Ajay Khoche, Erik Brunvand

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

Testing self-timed circuits using partial scan.

Ajay Khoche, Erik Brunvand

Proceedings of the Second Working Conference on Asynchronous Design Methodologies, 1995

1994

Testing micropipelines.

Ajay Khoche, Erik Brunvand

Proceedings of the International Symposium on Advanced Research in Asynchronous Circuits and Systems, 1994

1992

A Behavioral Fault Simulator for Ideal.

Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh, Raja Venkateswaran

IEEE Des. Test Comput., 1992

A Behavioral Fault Simulator For Ideal.

Ajay Khoche, Sunil D. Sherlekar, G. Venkatesh

Proceedings of the Fifth International Conference on VLSI Design, 1992