Toshiharu Asaka

According to our database1, Toshiharu Asaka authored at least 3 papers between 1997 and 2008.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2008
Shared At-Speed BIST for Parallel Test of SRAMs with Different Address Sizes.
Proceedings of the 17th IEEE Asian Test Symposium, 2008

2006
At-Speed Testing with Timing Exceptions and Constraints-Case Studies.
Proceedings of the 15th Asian Test Symposium, 2006

1997
H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997


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