Takeo Kobayashi

According to our database, Takeo Kobayashi authored at least 6 papers between 2006 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation.

Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2008

Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study.

Che-Jen Jerry Chang, Takeo Kobayashi

Proceedings of the 2008 IEEE International Test Conference, 2008

Enhancing Transition Fault Model for Delay Defect Diagnosis.

Wu-Tung Cheng, Brady Benware, Ruifeng Guo, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2006

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

Xijiang Lin, Kun-Han Tsai, Chen Wang, Mark Kassab, Janusz Rajski, Takeo Kobayashi, Randy Klingenberg, Yasuo Sato, Shuji Hamada, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

At-Speed Testing with Timing Exceptions and Constraints-Case Studies.

Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Takeo Kobayashi, Janusz Rajski, Bruce Swanson, Darryl Walters, Yasuo Sato, Toshiharu Asaka, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

Mentor Graphics DFT to Navigate Nanometer Test Challenges.

Greg Aldrich, Ron Press, Takeo Kobayashi, Tatsuo Sakajiri

Proceedings of the 15th Asian Test Symposium, 2006