Wang Liao

According to our database, Wang Liao authored at least 13 papers between 2017 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Genshin: A Generalized Framework with Software-Hardware Co-design and Pruned Fault Injection for Reliability Analysis.

Quan Cheng, Hao-Yang Chi, Chien-Hsing Liang, Yu-Hong Chao, Huizi Zhang, Yuan Liang, Mingtao Zhang, Wang Liao, Jinjun Xiong, Jing-Jia Liou, Masanori Hashimoto, Longyang Lin

Proceedings of the IEEE International Test Conference, 2025

HachiFI: A Lightweight SoC Architecture-Independent Fault-Injection Framework for SEU Impact Evaluation.

Quan Cheng, Wang Liao, Ruilin Zhang, Hao Yu, Longyang Lin, Masanori Hashimoto

Proceedings of the Design, Automation & Test in Europe Conference, 2025

2024

How accurately can soft error impact be estimated in black-box/white-box cases? - a case study with an edge AI SoC -.

Quan Cheng, Qiufeng Li, Longyang Lin, Wang Liao, Liuyao Dai, Hao Yu, Masanori Hashimoto

Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024

2023

Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons.

Kazusa Takami, Yuibi Gomi, Shin-ichiro Abe, Wang Liao, Seiya Manabe, Tetsuro Matsumoto, Masanori Hashimoto

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2021

Development of Autonomous Driving System based on Image Recognition using Programmable SoCs.

Ryohei Yamamoto, Yuki Izumi, Ryo Aono, Takumi Nagahara, Tomonari Tanaka, Wang Liao, Yukio Mitsuyama

Proceedings of the International Conference on Field-Programmable Technology, 2021

2020

Characterizing Energetic Dependence of Low-Energy Neutron-induced MCUs in 65 nm bulk SRAMs.

Wang Liao, Kojiro Ito, Yukio Mitsuyama, Masanori Hashimoto

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets.

Shin-ichiro Abe, Tatsuhiko Sato, Junya Kuroda, Seiya Manabe, Yukinobu Watanabe, Wang Liao, Kojiro Ito, Masanori Hashimoto, Masahide Harada, Kenichi Oikawa, Yasuhiro Miyake

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies.

Zheyu Yan, Yiyu Shi, Wang Liao, Masanori Hashimoto, Xichuan Zhou, Cheng Zhuo

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

Soft Error and Its Countermeasures in Terrestrial Environment.

Masanori Hashimoto, Wang Liao

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Analyzing Impacts of SRAM, FF and Combinational Circuit on Chip-Level Neutron-Induced Soft Error Rate.

Wang Liao, Masanori Hashimoto

IEICE Trans. Electron., 2019

Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs.

Wang Liao, Masanori Hashimoto, Seiya Manabe, Yukinobu Watanabe, Shin-ichiro Abe, Keita Nakano, Hayato Takeshita, Motonobu Tampo, Soshi Takeshita, Yasuhiro Miyake

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Development of Autonomous Driving System Using Programmable SoCs.

Tomonari Tanaka, Itsuki Ikeno, Riku Tsuruoka, Takumi Kuchiba, Wang Liao, Yukio Mitsuyama

Proceedings of the International Conference on Field-Programmable Technology, 2019

2017

Contributions of SRAM, FF and combinational circuit to chip-level neutron-induced soft error rate: - Bulk vs. FD-SOI at 0.5 and 1.0V -.

Wang Liao, Soichi Hirokawa, Ryo Harada, Masanori Hashimoto

Proceedings of the 15th IEEE International New Circuits and Systems Conference, 2017