Xuan Feng
Orcid: 0000-0002-5149-1140Affiliations:
- Zhejiang University, Hangzhou, China
According to our database1,
Xuan Feng
authored at least 4 papers
between 2014 and 2018.
Collaborative distances:
Collaborative distances:
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Bibliography
2018
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.
Microelectron. Reliab., 2018
2016
The variation of the leakage current characteristics of W/Ta<sub>2</sub>O<sub>5</sub>/W MIM capacitors with the thickness of the bottom W electrode.
Microelectron. Reliab., 2016
Effects of thermal annealing on the charge localization characteristics of HfO<sub>2</sub>/Au/HfO<sub>2</sub> stack.
Microelectron. Reliab., 2016
2014
On the current conduction mechanisms of CeO<sub>2</sub>/La<sub>2</sub>O<sub>3</sub> stacked gate dielectric.
Microelectron. Reliab., 2014