Yiqiang Chen

Orcid: 0000-0001-6901-3000

Affiliations:

China Electronic Produce Reliability and Environmental Testing Research Institute, Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, Guangzhou, China
Xiangtan University, China (PhD 2011)

According to our database¹, Yiqiang Chen authored at least 7 papers between 2017 and 2025.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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Bibliography

2025

Non-Contact Time-Varying Current Reconstruction for Electromagnetic Immunity Diagnosis in Electric Vehicle Module Injection Port Testing.

[BibT_eX]

[DOI]

Raúl Fernández-García

IEEE Trans. Ind. Electron., January, 2025

2024

Noninvasive Flexible Current Probe as a Diagnosis Tool Inside a PWM Chopper Module.

[BibT_eX]

[DOI]

Raúl Fernández-García

IEEE Trans. Instrum. Meas., 2024

2021

Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs.

[BibT_eX]

[DOI]

IEEE Access, 2021

2020

Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET.

[BibT_eX]

[DOI]

IEEE Access, 2020

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

2017

Movable Noncontact RF Current Measurement on a PCB Trace.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2017

Yiqiang Chen

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