Zhigang Ji
According to our database1,
Zhigang Ji
authored at least 32 papers
between 2009 and 2022.
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Bibliography
2022
Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Fast Video Facial Expression Recognition by a Deeply Tensor-Compressed LSTM Neural Network for Mobile Devices.
ACM Trans. Internet Things, 2021
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude.
IEEE Access, 2021
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing.
IEEE Access, 2021
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Proceedings of the International Conference on IC Design and Technology, 2021
An integrated method for extracting the statistical distribution of RTN time constants.
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
Appl. Soft Comput., 2020
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants.
IEEE Access, 2020
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities.
Sci. China Inf. Sci., 2019
Proceedings of the International Conference on IC Design and Technology, 2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction.
Microelectron. Reliab., 2018
2017
3D Fabric: Differential Deceleration and Detour for Congestion Free Data Center Networks.
Proceedings of the Posters and Demos Proceedings of the Conference of the ACM Special Interest Group on Data Communication, 2017
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2015
Non-Real-Time Network Traffic in Software-Defined Networking: A Link Bandwidth Prediction-Based Algorithm.
Comput. Inf. Sci., 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
2014
Microelectron. Reliab., 2014
Proceedings of the 11th IEEE International Conference on Mobile Ad Hoc and Sensor Systems, 2014
2010
The Research on Modeling Document Summarization for Audio-Based Knowledge Management.
J. Softw., 2010
2009
Proceedings of the Second International Workshop on Knowledge Discovery and Data Mining, 2009
Proceedings of the 2009 IITA International Conference on Services Science, 2009
Evaluate the Selection of Logistics Centre Location Using SVM Based on Principal Component Analysis.
Proceedings of the 2009 Pacific-Asia Conference on Circuits, Communications and Systems, 2009
Evaluation of Management Information System Based on Fuzzy AHP and Multiple Matter Elements.
Proceedings of the 2009 Pacific-Asia Conference on Circuits, Communications and Systems, 2009