Zhigang Ji

Orcid: 0009-0000-3776-1071

According to our database1, Zhigang Ji authored at least 49 papers between 2009 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Infinite-LLM: Efficient LLM Service for Long Context with DistAttention and Distributed KVCache.
CoRR, 2024

CrossBind: Collaborative Cross-Modal Identification of Protein Nucleic-Acid-Binding Residues.
Proceedings of the Thirty-Eighth AAAI Conference on Artificial Intelligence, 2024

2023
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2023

A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis.
ACM Trans. Design Autom. Electr. Syst., July, 2023

Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2023

Efficient Aging-Aware Standard Cell Library Characterization Based on Sensitivity Analysis.
IEEE Trans. Circuits Syst. II Express Briefs, February, 2023

Towards Accurate Oriented Object Detection in Aerial Images with Adaptive Multi-level Feature Fusion.
ACM Trans. Multim. Comput. Commun. Appl., January, 2023

A Pragmatic Model to Predict Future Device Aging.
IEEE Access, 2023

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

ChameleMon: Shifting Measurement Attention as Network State Changes.
Proceedings of the ACM SIGCOMM 2023 Conference, 2023

Double-sided Row Hammer Effect in Sub-20 nm DRAM: Physical Mechanism, Key Features and Mitigation.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Towards the understanding of ferroelectric-intrinsic variability and reliability issues on MCAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps.
Proceedings of the 15th IEEE International Conference on ASIC, 2023

2022
A Space-Time Neural Network for Analysis of Stress Evolution Under DC Current Stressing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors.
Sci. China Inf. Sci., 2022

Characterization and Modelling of Hot Carrier Degradation in pFETs under Vd>Vg Condition for sub-20nm DRAM Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

New Insight into the Aging Induced Retention Time Degraded of Advanced DRAM Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Towards a more efficient few-shot learning-based human gesture recognition via dynamic vision sensors.
Proceedings of the 33rd British Machine Vision Conference 2022, 2022

2021
Fast Video Facial Expression Recognition by a Deeply Tensor-Compressed LSTM Neural Network for Mobile Devices.
ACM Trans. Internet Things, 2021

On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude.
IEEE Access, 2021

Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing.
IEEE Access, 2021

A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Understanding Generated RTN as an Entropy Source for True Random Number Generators.
Proceedings of the International Conference on IC Design and Technology, 2021

An integrated method for extracting the statistical distribution of RTN time constants.
Proceedings of the 14th IEEE International Conference on ASIC, 2021

2020
Real-time deep reinforcement learning based vehicle navigation.
Appl. Soft Comput., 2020

Dual-Point Technique for Multi-Trap RTN Signal Extraction.
IEEE Access, 2020

An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants.
IEEE Access, 2020

Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Design for reliability with the advanced integrated circuit (IC) technology: challenges and opportunities.
Sci. China Inf. Sci., 2019

Voltage step stress: a technique for reducing test time of device ageing.
Proceedings of the International Conference on IC Design and Technology, 2019

An assessment of RTN-induced threshold voltage jitter.
Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction.
Microelectron. Reliab., 2018

2017
3D Fabric: Differential Deceleration and Detour for Congestion Free Data Center Networks.
Proceedings of the Posters and Demos Proceedings of the Conference of the ACM Special Interest Group on Data Communication, 2017

Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage.
Proceedings of the 12th IEEE International Conference on ASIC, 2017

2015
Non-Real-Time Network Traffic in Software-Defined Networking: A Link Bandwidth Prediction-Based Algorithm.
Comput. Inf. Sci., 2015

ESD characterization of planar InGaAs devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

NBTI prediction and its induced time dependent variation.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

2014
Energy distribution of positive charges in high-k dielectric.
Microelectron. Reliab., 2014

EMD-Based Multi-Model Prediction for Network Traffic in Software-Defined Networks.
Proceedings of the 11th IEEE International Conference on Mobile Ad Hoc and Sensor Systems, 2014

2010
The Research on Modeling Document Summarization for Audio-Based Knowledge Management.
J. Softw., 2010

2009
The Application of RBF Neural Network on Construction Cost Forecasting.
Proceedings of the Second International Workshop on Knowledge Discovery and Data Mining, 2009

Research on Knowledge Management for Person in E-learning.
Proceedings of the 2009 IITA International Conference on Services Science, 2009

Evaluate the Selection of Logistics Centre Location Using SVM Based on Principal Component Analysis.
Proceedings of the 2009 Pacific-Asia Conference on Circuits, Communications and Systems, 2009

Evaluation of Management Information System Based on Fuzzy AHP and Multiple Matter Elements.
Proceedings of the 2009 Pacific-Asia Conference on Circuits, Communications and Systems, 2009


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