Yizi Xing

According to our database, Yizi Xing authored at least 8 papers between 2006 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2012

Diagnosis of Local Spot Defects in Analog Circuits.

Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman

IEEE Trans. Instrum. Meas., 2012

Defect Oriented Testing for Analog/Mixed-Signal Designs.

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing

IEEE Des. Test Comput., 2012

2011

Defect Oriented Testing for analog/mixed-signal devices.

Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing

Proceedings of the 2011 IEEE International Test Conference, 2011

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices.

Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.

Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Design-for-Test of Digitally-Assisted Analog IPs for Automotive SoCs.

Yizi Xing, Liquan Fang

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2007

Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC.

Liquan Fang, Yang Zhong, H. van de Donk, Yizi Xing

Proceedings of the 16th Asian Test Symposium, 2007

2006

Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs.

Liquan Fang, Mohammed Lemnawar, Yizi Xing

Proceedings of the 2006 IEEE International Test Conference, 2006