Andrea Cester

According to our database, Andrea Cester authored at least 26 papers between 2003 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Design and in vitro Characterization of a Wearable Multisensing System for Hydration Monitoring.

Sarah Tonello, Alberto Zacchini, Alessandra Galli, Ata Golparvar, Ali Meimandi, Giacomo Peruzzi, Alessandro Pozzebon, Nicolò Lago, Andrea Cester, Giada Giorgi, Sandro Carrara, Claudio Narduzzi

IEEE Trans. Instrum. Meas., 2024

2023

Signal amplification properties of Electrolyte-Gated Organic Field-Effect Transistors.

Nicolò Lago, Sara Ruiz Molina, Marta Mas Torrent, Stefano Casalini, Andrea Cester

Proceedings of the 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2023

2022

A Morphological Peak-Detector for Single-Unit Neural Recording Acquisition Systems.

Alessandra Galli, Nicolò Lago, Sarah Tonello, Mario Bortolozzi, Marco Buonomo, Morten Gram Pedersen, Andrea Cester, Giada Giorgi

IEEE Trans. Instrum. Meas., 2022

2021

RL-EGOFET cell biosensors: A novel approach for the detection of action potentials.

Giada Giorgi, Nicolò Lago, Sarah Tonello, Alessandra Galli, M. Buonuomo, Morten Gram Pedersen, Andrea Cester

Proceedings of the IEEE International Symposium on Medical Measurements and Applications, 2021

2020

Organic substrates for novel printed sensors in neural interfacing: a measurement method for cytocompatibility analysis.

Sarah Tonello, Giada Giorgi, Simona Pisu, Andrea Cester

Proceedings of the 2020 IEEE International Symposium on Medical Measurements and Applications, 2020

2018

Effects of stair case gate bias stress in IGZO/Al₂O₃ flexible TFTs.

Marco Buonomo, Nicola Wrachien, Nicolò Lago, Giuseppe Cantarella, Andrea Cester

Microelectron. Reliab., 2018

Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique.

Marco Buonomo, Lorenzo Torto, Marco Barbato, Nicola Wrachien, Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, Andrea Cester

Microelectron. Reliab., 2018

2015

Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics.

Nicola Wrachien, Nicolò Lago, Antonio Rizzo, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2015

Effects of constant voltage and constant current stress in PCBM: P3HT solar cells.

Andrea Cester, Antonio Rizzo, A. Bazzega, Nicolò Lago, J. Favaro, Marco Barbato, Nicola Wrachien, Suren A. Gevorgyan, Michael Corazza, Frederik C. Krebs

Microelectron. Reliab., 2015

Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects.

Andrea Cester, Nicola Wrachien, Massimiliano Bon, Gaudenzio Meneghesso, Roberta Bertani, Roberto Tagliaferro, Simone Casolucci, Thomas M. Brown, Andrea Reale, Aldo Di Carlo

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Stress-induced instabilities of shunt paths in high efficiency MWT solar cells.

Marco Barbato, Matteo Meneghini, Andrea Cester, Alessandro Barbato, Enrico Zanoni, Gaudenzio Meneghesso, Giovanna Mura, D. Tonini, A. Voltan, Giorgio Cellere

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states.

Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini

Microelectron. Reliab., 2014

Effects of constant voltage stress on organic complementary logic inverters.

Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini

Proceedings of the 44th European Solid State Device Research Conference, 2014

Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs.

Davide Bisi, Antonio Stocco, Matteo Meneghini, Fabiana Rampazzo, Andrea Cester, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings of the 44th European Solid State Device Research Conference, 2014

Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures.

Marco Barbato, Andrea Cester, Viviana Mulloni, Benno Margesin, Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso

Proceedings of the 44th European Solid State Device Research Conference, 2014

2013

Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric.

Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso

Microelectron. Reliab., 2013

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells.

Alessandro Compagnin, Matteo Meneghini, Marco Barbato, Valentina Giliberto, Andrea Cester, Massimo Vanzi, Giovanna Mura, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2013

Comparison between positive and negative constant current stress on dye-sensitized solar cells.

Daniele Bari, Nicola Wrachien, R. Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2013

2012

Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure.

Nicola Wrachien, Daniel Bari, Jaroslav Kovác, Jan Jakabovic, Daniel Donoval, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2012

Reliability study of dye-sensitized solar cells by means of solar simulator and white LED.

Daniele Bari, Nicola Wrachien, Roberto Tagliaferro, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2012

2011

Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs).

Daniele Bari, Nicola Wrachien, R. Tagliaferro, Stefano Penna, Thomas M. Brown, Andrea Reale, Aldo Di Carlo, Gaudenzio Meneghesso, Andrea Cester

Microelectron. Reliab., 2011

2010

Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED.

Andrea Cester, Daniele Bari, J. Framarin, Nicola Wrachien, Gaudenzio Meneghesso, S. Xia, V. Adamovich, J. J. Brown

Microelectron. Reliab., 2010

2007

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.

Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini

Microelectron. Reliab., 2007

Ionising radiation and electrical stress on nanocrystal memory cell array.

Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi

Microelectron. Reliab., 2007

2006

Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.

Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini

Microelectron. Reliab., 2006

2003

Ionising radiation effects on MOSFET drain current.

S. Cimino, Andrea Cester, Alessandro Paccagnella, G. Ghidini

Microelectron. Reliab., 2003