Alessandro Paccagnella
Orcid: 0000-0002-6850-4286
According to our database1,
Alessandro Paccagnella
authored at least 35 papers
between 2003 and 2023.
Collaborative distances:
Collaborative distances:
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Bibliography
2023
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications.
IEEE Trans. Instrum. Meas., 2023
Sensors, 2023
Multiphysics simulations of screen-printed electrodes for electrochemical biosensing.
Proceedings of the 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2023
Electrochemical Biosensor for Timely Detection of Lactococcus Lactis Bacteriophage in Milk Samples.
Proceedings of the 2023 IEEE SENSORS, Vienna, Austria, October 29 - Nov. 1, 2023, 2023
2019
A simple and accessible inkjet platform for ultra-short concept-to-prototype sEMG electrodes production.
Proceedings of the 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2019
2018
2016
Optimization of Cyclic Voltammetric Curve Parameters to Measure Lactate Concentration in Urine Samples.
Proceedings of the Sensors, 2016
2015
IEEE Trans. Very Large Scale Integr. Syst., 2015
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments.
Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015
A subthreshold, low-power, RHBD reference circuit, for earth observation and communication satellites.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
2014
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2012
Microelectron. Reliab., 2012
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies.
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012
Low-cost Enzyme-based Biosensor for Lactic Acid Amperometric Detection - Electrical Modeling and Validation for Clinical and Food Processing Applications.
Proceedings of the BIODEVICES 2012 - Proceedings of the International Conference on Biomedical Electronics and Devices, Vilamoura, Algarve, Portugal, 1, 2012
2011
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011
2010
Microelectron. Reliab., 2010
Microelectron. Reliab., 2010
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
2009
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009
2008
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
2007
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
Microelectron. Reliab., 2007
Microelectron. Reliab., 2007
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs.
Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007
2006
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.
Microelectron. Reliab., 2006
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab., 2006
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006
2005
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005
2004
Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA.
Proceedings of the 2004 Design, 2004
2003
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003