Artemisia Tsiara

According to our database, Artemisia Tsiara authored at least 7 papers between 2020 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Lifetime Model for Enabling Reliable InGaAs/GaAs Nano-Ridge Lasers Monolithically Integrated on 300 mm Silicon.

Ping-Yi Hsieh, Artemisia Tsiara, Barry J. O'Sullivan, Sara El Akel, Huseyin Sar, Debi Prasad Panda, Peter Swekis, Didit Yudistira, Bernardette Kunert, Joris Van Campenhout, Ingrid De Wolf

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2025

2024

Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors.

S. Musibau, N. Poumpouridis, Artemisia Tsiara, J. Franco, Mathias Berciano, Joris Van Campenhout, I. De Wout, K. Crees

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors.

Ping-Yi Hsieh, Ameni Ben Driss, Artemisia Tsiara, Barry J. O'Sullivan, Didit Yudistira, Bernardette Kunert, Joris Van Campenhout, Ingrid De Wolf

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022

Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors.

Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, Philippe Absil

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2022

Degradation mechanisms in Germanium Electro-Absorption Modulators.

Artemisia Tsiara, Alicja Lesniewska, Philippe Roussel, Srinivasan Ashwyn Srinivasan, Mathias Berciano, Marko Simicic, Marianna Pantouvaki, Joris Van Campenhout, Kristof Croes

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon.

Ping-Yi Hsieh, Artemisia Tsiara, Barry J. O'Sullivan, Didit Yudistira, Marina Baryshnikova, Guido Groeseneken, Bernardette Kunert, Marianna Pantouvaki, Joris Van Campenhout, Ingrid De Wolf

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Electrical and Optical Reliability Analysis of GeSi Electro-Absorption Modulators.

Artemisia Tsiara, S. A. Srinivasan, S. Balakrishnan, Marianna Pantouvaki, Philippe Absil, Joris Van Campenhout, Kris Croes

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2020