Ben Mathew

According to our database, Ben Mathew authored at least 12 papers between 1992 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

Accurately Determining Bridging Defects from Layout.

Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

2005

Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST.

Peter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2004

Understanding Yield Losses in Logic Circuits.

Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew

IEEE Des. Test Comput., 2004

Yield Analysis of Logic Circuits.

Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

1999

Combining multiple DFT schemes with test generation.

Ben Mathew, Daniel G. Saab

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1998

FakeFault: a silicon debug software tool for microprocessor embedded memory arrays.

Young-Jun Kwon, Ben Mathew, Hong Hao

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Testability Features of R10000 Microprocessor.

Junji Mori, Ben Mathew, Dave Burns, Yeuk-Hai Mok

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1995

DFT & ATPG: Together Again.

Ben Mathew, Daniel G. Saab

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Partial Reset: An Alternative DFT Approach.

Ben Mathew, Daniel G. Saab

VLSI Design, 1994

1993

On Selecting Flip-Flops for Partial Reset.

Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Augmented partial reset.

Ben Mathew, Daniel G. Saab

Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1992

Robust switch-level test generation.

Ben Mathew, Daniel G. Saab

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992