Bharath Seshadri

According to our database, Bharath Seshadri authored at least 8 papers between 2003 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2008

On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.

Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

2006

Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification.

Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Dominance Based Analysis for Large Volume Production Fail Diagnosis.

Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen, Sudhakar M. Reddy

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

Path-oriented transition fault test generation considering operating conditions.

Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu

Proceedings of the 10th European Test Symposium, 2005

2004

The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults.

Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Z-Sets and Z-Detections: Circuit Characteristics that Simplify Fault Diagnosis.

Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Bharath Seshadri

Proceedings of the 2004 Design, 2004

2003

A Model for Performance Analysis of MPI Applications on Terascale Systems.

Srigurunath Chakravarthi, C. R. Krishna Kumar, Anthony Skjellum, H. A. Prahalad, Bharath Seshadri

Proceedings of the Recent Advances in Parallel Virtual Machine and Message Passing Interface,10th European PVM/MPI Users' Group Meeting, Venice, Italy, September 29, 2003

On path selection for delay fault testing considering operating conditions [logic IC testing].

Bharath Seshadri, Irith Pomeranz, Sudhakar M. Reddy, Sandip Kundu

Proceedings of the 8th European Test Workshop, 2003