Carl Barnhart

According to our database, Carl Barnhart authored at least 8 papers between 2000 and 2004.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts

Proceedings of the 2004 Design, 2004

2003

IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.

Bill Eklow, Carl Barnhart, Kenneth P. Parker

IEEE Des. Test Comput., 2003

IEEE 1149.6 - A Practical Perspective.

Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Extending OPMISR beyond 10x Scan Test Efficiency.

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera

IEEE Des. Test Comput., 2002

IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.

Bill Eklow, Carl Barnhart, Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

OPMISR: the foundation for compressed ATPG vectors.

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

A SmartBIST Variant with Guaranteed Encoding.

Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

Integrating Logic BIST in VLSI Designs with Embedded Memories.

Vivek Chickermane, Scott Richter, Carl Barnhart

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000