Mike Ricchetti

According to our database, Mike Ricchetti authored at least 12 papers between 1988 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Special panel session IIB: "System validation and silicon debug - Is standardization possible?".

Mike Ricchetti, Eric Rentschler, Amit Majumdar, Mike Lowe, Mark LaVine, Skip Lindsey, Sharad Kumar

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Innovative practices session 3C: Advances in silicon debug & diagnosis.

Mike Ricchetti

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2013

Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs.

Arie Margulis, David Akselrod, Eric Rentschler, Mike Ricchetti

IEEE Des. Test, 2013

2006

IEEE P1687: Toward Standardized Access of Embedded Instrumentation.

Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems.

C. J. Clark, Mike Ricchetti

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Infrastructure IP for Configuration and Test of Boards and Systems.

C. J. Clark, Mike Ricchetti

IEEE Des. Test Comput., 2003

IEEE 1149.6 - A Practical Perspective.

Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

On IEEE P1500's Standard for Embedded Core Test.

Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian

J. Electron. Test., 2002

Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?

Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001

IP and Automation to Support IEEE P1500.

Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

1998

Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard.

Bulent I. Dervisoglu, Mike Ricchetti, William Eklow

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1988

Scan Diagnostic Strategy for the Series 10000 Prism Workstation.

Mike Ricchetti, John Hoglund

Proceedings of the Proceedings International Test Conference 1988, 1988