Mike Ricchetti

According to our database1, Mike Ricchetti authored at least 12 papers between 1988 and 2016.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2016
Special panel session IIB: "System validation and silicon debug - Is standardization possible?".
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015
Innovative practices session 3C: Advances in silicon debug & diagnosis.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2013
Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs.
IEEE Des. Test, 2013

2006
IEEE P1687: Toward Standardized Access of Embedded Instrumentation.
Proceedings of the 2006 IEEE International Test Conference, 2006

2004
A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003
Infrastructure IP for Configuration and Test of Boards and Systems.
IEEE Des. Test Comput., 2003

IEEE 1149.6 - A Practical Perspective.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
On IEEE P1500's Standard for Embedded Core Test.
J. Electron. Test., 2002

Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001
IP and Automation to Support IEEE P1500.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

1998
Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1988
Scan Diagnostic Strategy for the Series 10000 Prism Workstation.
Proceedings of the Proceedings International Test Conference 1988, 1988


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