Adam Cron

According to our database, Adam Cron authored at least 12 papers between 1996 and 2023.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2023

CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme.

Mridha Md Mashahedur Rahman, M. Sazadur Rahman, Rasheed Kibria, Mike Borza, Bandy Reddy, Adam Cron, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

2022

Applying IEEE Test Standards to Multidie Designs.

Teresa McLaurin, Adam Cron

IEEE Des. Test, 2022

Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages.

Adam Cron, Hailong Jiao, Erik Jan Marinissen

IEEE Des. Test, 2022

2021

Quantifiable Assurance: From IPs to Platforms.

Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed A. Abdelmoneum, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor

IACR Cryptol. ePrint Arch., 2021

IEEE Standard 1838 Is on the Move.

Adam Cron, Erik Jan Marinissen

Computer, 2021

POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly.

Md Sami Ul Islam Sami, Fahim Rahman, Adam Cron, Dale R. Donchin, Mike Borza, Farimah Farahmandi, Mark M. Tehranipoor

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021

Invited: End-to-End Secure SoC Lifecycle Management.

Md Sami Ul Islam Sami, Fahim Rahman, Farimah Farahmandi, Adam Cron, Mike Borza, Mark M. Tehranipoor

Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021

2018

IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers.

Yu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen

Proceedings of the 23rd IEEE European Test Symposium, 2018

2006

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test.

Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts

Proceedings of the 2004 Design, 2004

1997

IEEE P1149.4-Almost a Standard.

Adam Cron

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

A D&T Special Report: P1149.4 Mixed-Signal Test Bus.

Adam Cron

IEEE Des. Test Comput., 1996