Bernd Könemann

According to our database, Bernd Könemann authored at least 9 papers between 1992 and 2003.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2003

Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities.

Bernd Könemann

Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003

2002

Extending OPMISR beyond 10x Scan Test Efficiency.

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera

IEEE Des. Test Comput., 2002

2001

OPMISR: the foundation for compressed ATPG vectors.

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

A SmartBIST Variant with Guaranteed Encoding.

Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1996

Built-In Self-Test: Assuring System Integrity.

Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie

Computer, 1996

1993

Testable Programmable Digital Clock Pulse Control Elements.

Kenneth D. Wagner, Bernd Könemann

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

A Test Generation Methodology for High-Performance Computer Chips and Modules.

Bernd Könemann, Phil Noto

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Delay Test: The Next Frontier for LSSD Test Systems.

Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, T. Williams

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

AC Test Quality: Beyond Transition Fault Coverage.

Yaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, Barry K. Rosen

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992