Cheolgyu Kim
Orcid: 0009-0000-9773-1835
According to our database1,
Cheolgyu Kim
authored at least 10 papers
between 2012 and 2025.
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Bibliography
2025
Experimental Implementation of a 3-Level TNPC-IGBT Inverter for Uniform Stress Distribution and THD Mitigation: MPC-Driven Switching Optimization, LCL Filter Integration, and Real-Time Stress Monitoring.
IEEE Access, 2025
Rapid Fault-Tolerant MPC Strategy for Six-Phase PMSMs: Optimizing Torque Stability, Current Constraint Management During Phase Transition.
IEEE Access, 2025
2021
Somatosensory actuator based on stretchable conductive photothermally responsive hydrogel.
Sci. Robotics, 2021
2017
Fast and accurate method of lifetime estimation for HfSiON/SiO<sub>2</sub> dielectric n-MOSFETs under positive bias temperature instability.
Microelectron. Reliab., 2017
Mechanism of warpage orientation rotation due to viscoelastic polymer substrates during thermal processing.
Microelectron. Reliab., 2017
2014
Voltage dependent degradation of HfSiON/SiO<sub>2</sub> nMOSFETs under positive bias temperature instability.
Microelectron. Reliab., 2014
2013
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs.
Microelectron. Reliab., 2013
2012
Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs.
Microelectron. Reliab., 2012
Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs.
Microelectron. Reliab., 2012
Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress.
Microelectron. Reliab., 2012