Cheolgyu Kim

Orcid: 0009-0000-9773-1835

According to our database1, Cheolgyu Kim authored at least 10 papers between 2012 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2025
Experimental Implementation of a 3-Level TNPC-IGBT Inverter for Uniform Stress Distribution and THD Mitigation: MPC-Driven Switching Optimization, LCL Filter Integration, and Real-Time Stress Monitoring.
IEEE Access, 2025

Rapid Fault-Tolerant MPC Strategy for Six-Phase PMSMs: Optimizing Torque Stability, Current Constraint Management During Phase Transition.
IEEE Access, 2025

2021
Somatosensory actuator based on stretchable conductive photothermally responsive hydrogel.
Sci. Robotics, 2021

2017
Fast and accurate method of lifetime estimation for HfSiON/SiO<sub>2</sub> dielectric n-MOSFETs under positive bias temperature instability.
Microelectron. Reliab., 2017

Mechanism of warpage orientation rotation due to viscoelastic polymer substrates during thermal processing.
Microelectron. Reliab., 2017

2014
Voltage dependent degradation of HfSiON/SiO<sub>2</sub> nMOSFETs under positive bias temperature instability.
Microelectron. Reliab., 2014

2013
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs.
Microelectron. Reliab., 2013

2012
Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs.
Microelectron. Reliab., 2012

Effect of electron-electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs.
Microelectron. Reliab., 2012

Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress.
Microelectron. Reliab., 2012


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