Christoph Kerner

According to our database, Christoph Kerner authored at least 3 papers between 2007 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2012

Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques.

Christoph Kerner, Ivan Ciofi, Thomas Chiarella, Stefaan Van Huylenbroeck

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2009

Migrating from planar to FinFET for further CMOS scaling: SOI or bulk?

Thomas Chiarella, Liesbeth Witters, Abdelkarim Mercha, Christoph Kerner, Rok Dittrich, Michal Rakowski, Claude Ortolland, Lars-Åke Ragnarsson, Bertrand Parvais, An De Keersgieter, Stefan Kubicek, Augusto Redolfi, R. Rooyackers, C. Vrancken, S. Brus, A. Lauwers, Philippe Absil, S. Biesemans, Thomas Y. Hoffmann

Proceedings of the 35th European Solid-State Circuits Conference, 2009

2007

Optimization of HfSiON using a design of experiment (DOE) approach on 0.45 V V_t Ni-FUSI CMOS transistors.

A. Rothschild, R. Mitsuhashi, Christoph Kerner, X. Shi, J. L. Everaert, L. Date, Thierry Conard, Olivier Richard, C. Vrancken, R. Verbeeck, Anabela Veloso, A. Lauwers, Muriel de Potter de ten Broeck, I. Debusschere, M. Jurczak, M. Niwa, Philippe Absil, S. Biesemans

Microelectron. Reliab., 2007