M. Jurczak

According to our database, M. Jurczak authored at least 5 papers between 2005 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.

Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda

Proceedings of the Symposium on VLSI Circuits, 2015

2012

On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs.

Eddy Simoen, Marc Aoulaiche, Anabela Veloso, M. Jurczak, Cor Claeys, L. Mendes Almeida, Maria Glória Caño de Andrade, A. Luque Rodriguez, J. A. Jimenez Tejada, Christian Caillat, Pierre Fazan

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2007

Optimization of HfSiON using a design of experiment (DOE) approach on 0.45 V V_t Ni-FUSI CMOS transistors.

A. Rothschild, R. Mitsuhashi, Christoph Kerner, X. Shi, J. L. Everaert, L. Date, Thierry Conard, Olivier Richard, C. Vrancken, R. Verbeeck, Anabela Veloso, A. Lauwers, Muriel de Potter de ten Broeck, I. Debusschere, M. Jurczak, M. Niwa, Philippe Absil, S. Biesemans

Microelectron. Reliab., 2007

Layout options for stability tuning of SRAM cells in multi-gate-FET technologies.

Florian Bauer, Klaus von Arnim, Christian Pacha, Thomas Schulz, Michael Fulde, Axel Nackaerts, M. Jurczak, Wade Xiong, K. T. San, C. Rinn Cleavelin, Klaus Schruefer, Georg Georgakos, Doris Schmitt-Landsiedel

Proceedings of the 33rd European Solid-State Circuits Conference, 2007

2005

Optimization of low temperature silicon nitride processes for improvement of device performance.

E. Sleeckx, Marc Schaekers, X. Shi, E. Kunnen, B. Degroote, M. Jurczak, Muriel de Potter de ten Broeck, E. Augendre

Microelectron. Reliab., 2005