Sebastian Siatkowski

According to our database, Sebastian Siatkowski authored at least 6 papers between 2014 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

Learning the process for correlation analysis.

Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Some considerations on choosing an outlier method for automotive product lines.

Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg

Proceedings of the IEEE International Test Conference, 2017

Feature extraction from design documents to enable rule learning for improving assertion coverage.

Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

Consistency in wafer based outlier screening.

Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Generalization of an outlier model into a "global" perspective.

Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Yield optimization using advanced statistical correlation methods.

Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2014 International Test Conference, 2014