Chujun Yin

According to our database1, Chujun Yin authored at least 2 papers between 2024 and 2025.

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Bibliography

2025
Device-Aware Test for Threshold Voltage Shifting in FeFET.
Proceedings of the IEEE International Test Conference, 2025

2024
Defects, Fault Modeling, and Test Development Framework for FeFETs.
Proceedings of the IEEE International Test Conference, 2024


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