Nicolò Bellarmino

According to our database, Nicolò Bellarmino authored at least 9 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Multilabel Active Learning Framework for Microcontroller Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

COVID-19 Detection from Mass Spectra of Exhaled Breath.

Nicolò Bellarmino, Giorgio Bozzini, Riccardo Cantoro, Francesco Castelletti, Michele Castelluzzo, Carla Ciricugno, Raffaele Correale, Daniela Dalla Gasperina, Francesco Dentali, Giovanni Poggialini, Piergiorgio Salerno, Giovanni Squillero, Stefano Taborelli

CoRR, 2023

U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration.

Nicolò Bellarmino, Riccardo Cantoro, Giovanni Squillero

Proceedings of the Machine Learning, Optimization, and Data Science, 2023

Feature Selection for Cost Reduction In MCU Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Semi-Supervised Deep Learning for Microcontroller Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the IEEE European Test Symposium, 2023

Enabling Inter-Product Transfer Learning on MCU Performance Screening.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022

2021

Exploiting Active Learning for Microcontroller Performance Prediction.

Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Raffaele Martone, Ulf Schlichtmann, Giovanni Squillero

Proceedings of the 26th IEEE European Test Symposium, 2021