Davide Favero
Orcid: 0000-0002-5918-9472
According to our database1,
Davide Favero
authored at least 2 papers
between 2022 and 2023.
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Bibliography
2023
High- Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022