Shuzhen You

According to our database, Shuzhen You authored at least 10 papers between 2014 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Design and Optimization of Fractional-Turn Transformer With Low Core Loss and Profile.

Wenbao Han, Sheng-Lei Zhao, Longyang Yu, Shouzheng Zhang, Fangzuo Zhao, Haobin Wei, Daoyuan Li, Xuejing Sun, Wei Mu, Zheyuan Yu, Shuzhen You, Yue Hao, Jincheng Zhang

IEEE Trans. Ind. Electron., June, 2026

2025

Symmetrical GaN-Based Vertical Module With Low Interference Integration and High Thermal Performance for PoL Converters.

Longyang Yu, Sheng-Lei Zhao, Xuejing Sun, Wei Mu, Xiufeng Song, Shuzhen You, Yue Hao, Jincheng Zhang

IEEE Trans. Ind. Electron., December, 2025

Machine-learning-assisted EEHEMT compact modeling of GaN HEMTs.

Censong Liu, Jie Wang, Shuzhen You, Dawei Wang, Zhiping Yu

Microelectron. J., 2025

2022

Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs.

Davide Favero, Carlo De Santi, Kalparupa Mukherjee, Karen Geens, Matteo Borga, Benoit Bakeroot, Shuzhen You, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications.

Elena Fabris, Matteo Borga, Niels Posthuma, Ming Zhao, Brice De Jaeger, Shuzhen You, Stefaan Decoutere, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors.

Kalparupa Mukherjee, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Shuzhen You, Karen Geens, Matteo Borga, Benoit Bakeroot, Stefaan Decoutere

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Monolithically integrated GaN power ICs designed using the MIT virtual source GaNFET (MVSG) compact model for enhancement-mode p-GaN gate power HEMTs, logic transistors and resistors.

Shuzhen You, Xiangdong Li, Stefaan Decoutere, Guido Groeseneken, Zhanfei Chen, Jun Liu, Yuki Yamashita, Kazutoshi Kobayashi

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2014

Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs under a constant current stress.

Tian-Li Wu, Denis Marcon, Steve Stoffels, Shuzhen You, Brice De Jaeger, Marleen Van Hove, Guido Groeseneken, Stefaan Decoutere

Microelectron. Reliab., 2014

Physical origin of current collapse in Au-free AlGaN/GaN Schottky Barrier Diodes.

Jie Hu, Steve Stoffels, Silvia Lenci, Nicolo Ronchi, Rafael Venegas, Shuzhen You, Benoit Bakeroot, Guido Groeseneken, Stefaan Decoutere

Microelectron. Reliab., 2014

Breakdown investigation in GaN-based MIS-HEMT devices.

Fabio Alessio Marino, Davide Bisi, Matteo Meneghini, Giovanni Verzellesi, Enrico Zanoni, Marleen Van Hove, Shuzhen You, Stefaan Decoutere, Denis Marcon, Steve Stoffels, Nicolo Ronchi, Gaudenzio Meneghesso

Proceedings of the 44th European Solid State Device Research Conference, 2014