Deepesh Sahoo
Orcid: 0009-0009-7648-2396
According to our database1,
Deepesh Sahoo authored at least 6 papers
between 2020 and 2026.
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Bibliography
2026
IEEE Trans. Very Large Scale Integr. Syst., April, 2026
2025
Proceedings of the IEEE International Test Conference, 2025
LLM-Aided In-Field Workload Generation for Detecting Silent Data Corruptions at Scale.
Proceedings of the IEEE International Test Conference, 2025
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2025
2024
Proceedings of the IEEE International Test Conference, 2024
2020