Dhruv Thapar

According to our database, Dhruv Thapar authored at least 17 papers between 2019 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Modeling and Analysis of Defects and Variations in Multibit FeFET Devices and Crossbar Architectures.

Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2026

WARP-TPG: Warpage-Aware Test Pattern Generation for Small-Delay Defects.

Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

NERT: Network- and Routing-aware Testing of Interconnects in Fanout Wafer-Level Packaging.

Dhruv Thapar, Partho Bhoumik, Arjun Chaudhuri, Krishnendu Chakrabarty

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

WARP: Workload-Aware Reference Prediction for Reliable Multi-Bit FeFET Readout under Charge-Trapping Degradation.

Dhruv Thapar, Ashish Reddy Bommana, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty

Proceedings of the 31st Asia and South Pacific Design Automation Conference, 2026

2025

SPICED+: Syntactical Bug Pattern Identification and Correction of Trojans in A/MS Circuits Using LLM-Enhanced Detection.

Jayeeta Chaudhuri, Dhruv Thapar, Arjun Chaudhuri, Farshad Firouzi, Krishnendu Chakrabarty

IEEE Trans. Very Large Scale Integr. Syst., April, 2025

FeTest: Defect Analysis and March Test Solution for FeFETs ^*.

Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

NeuralTPG: GPU-Accelerated Neural Twin-Based Test Pattern Generation for Transition Delay Faults in Safety-Critical Applications.

Xuanyi Tan, Gitanjali Mukherjee, Dhruv Thapar, Arjun Chaudhuri, Sanmitra Banerjee, Rubin A. Parekhji, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

SMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level Packages^*.

Partho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2025

On the Impact of Warpage on BEOL Geometry and Path Delays in Fan-out Wafer-Level Packaging.

Dhruv Thapar, Arjun Chaudhuri, Christopher Bailey, Ravi Mahajan, Krishnendu Chakrabarty

Proceedings of the Design, Automation & Test in Europe Conference, 2025

2024

SPICED: Syntactical Bug and Trojan Pattern Identification in A/MS Circuits using LLM-Enhanced Detection.

Jayeeta Chaudhuri, Dhruv Thapar, Arjun Chaudhuri, Farshad Firouzi, Krishnendu Chakrabarty

CoRR, 2024

Defect Analysis for FeFETs using a Compact Model.

Dhruv Thapar, Arjun Chaudhuri, Kai Ni, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2024

Safety-Guided Test Generation for Structural Faults.

Xuanyi Tan, Dhruv Thapar, Deepesh Sahoo, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty, Rubin A. Parekhji

Proceedings of the IEEE International Test Conference, 2024

2023

Analysis and Characterization of Defects in FeFETs.

Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty

Proceedings of the IEEE International Test Conference, 2023

2021

Deep Learning assisted Cross-Family Profiled Side-Channel Attacks using Transfer Learning.

Dhruv Thapar, Manaar Alam, Debdeep Mukhopadhyay

Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021

2020

TranSCA: Cross-Family Profiled Side-Channel Attacks using Transfer Learning on Deep Neural Networks.

Dhruv Thapar, Manaar Alam, Debdeep Mukhopadhyay

IACR Cryptol. ePrint Arch., 2020

2019

Adaptive Multi-bit SRAM Topology Based Analog PUF.

Sudarshan Sharma, Dhruv Thapar, Nikhil Bhelave, Mrigank Sharad

CoRR, 2019

Design of a Chaotic Oscillator based Model Building Attack Resistant Arbiter PUF.

Venkata Sreekanth Balijabudda, Dhruv Thapar, Pranesh Santikellur, Rajat Subhra Chakraborty, Indrajit Chakrabarti

Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2019