Sanmitra Banerjee
Orcid: 0000-0002-1136-9220
According to our database1,
Sanmitra Banerjee
authored at least 34 papers
between 2018 and 2024.
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Bibliography
2024
Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration.
IEEE Trans. Very Large Scale Integr. Syst., July, 2024
DOCTOR: Dynamic On-Chip Remediation Against Temporally-Drifting Thermal Variations Toward Self-Corrected Photonic Tensor Accelerators.
CoRR, 2024
2023
Transferable Graph Neural Network-Based Delay-Fault Localization for Monolithic 3-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023
IEEE Des. Test, April, 2023
IEEE Trans. Very Large Scale Integr. Syst., March, 2023
CoRR, 2023
Analysis of Optical Loss and Crosstalk Noise in MZI-based Coherent Photonic Neural Networks.
CoRR, 2023
Special Session: Using Graph Neural Networks for Tier-Level Fault Localization in Monolithic 3D ICs <sup>*</sup>.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs.
Proceedings of the IEEE International Test Conference, 2023
2022
ACM J. Emerg. Technol. Comput. Syst., 2022
ACM J. Emerg. Technol. Comput. Syst., 2022
CoRR, 2022
Characterization and Optimization of Integrated Silicon-Photonic Neural Networks under Fabrication-Process Variations.
CoRR, 2022
CHAMP: Coherent Hardware-Aware Magnitude Pruning of Integrated Photonic Neural Networks.
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2022
Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration.
Proceedings of the IEEE International Test Conference, 2022
Pruning Coherent Integrated Photonic Neural Networks Using the Lottery Ticket Hypothesis.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2022
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022
Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022
LoCI: An Analysis of the Impact of Optical Loss and Crosstalk Noise in Integrated Silicon-Photonic Neural Networks.
Proceedings of the GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6, 2022
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022
2021
IEEE Trans. Very Large Scale Integr. Syst., 2021
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2021
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
2020
Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs.
IEEE Trans. Very Large Scale Integr. Syst., 2020
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020
NodeRank: Observation-Point Insertion for Fault Localization in Monolithic 3D ICs<sup>∗</sup>.
Proceedings of the 29th IEEE Asian Test Symposium, 2020
2019
Proceedings of the 24th IEEE European Test Symposium, 2019
Proceedings of the 56th Annual Design Automation Conference 2019, 2019
2018
IEEE Trans. Instrum. Meas., 2018
Grading heart sounds through variational mode decomposition and higher order spectral features.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018